James Alan Turnquist

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Event based IC test system
- Patent number 7,089,135
- Issue date Aug 8, 2006
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
Event based semiconductor test system
- Patent number 6,678,643
- Issue date Jan 13, 2004
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for successively generating an event to establ...
- Patent number 6,668,331
- Issue date Dec 23, 2003
- Advantest Corp.
- Glen A. Gomes
- G01 - MEASURING TESTING
Information Patent Grant
Data failure memory compaction for semiconductor test system
- Patent number 6,578,169
- Issue date Jun 10, 2003
- Advantest Corp.
- Anthony Le
- G11 - INFORMATION STORAGE
Information Patent Grant
Event based test system storing pin calibration data in non-volatil...
- Patent number 6,567,941
- Issue date May 20, 2003
- Advantest Corp.
- James Alan Turnquist
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test system supporting multiple virtual logic testers
- Patent number 6,557,128
- Issue date Apr 29, 2003
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Event based semiconductor test system
- Patent number 6,532,561
- Issue date Mar 11, 2003
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Multiple end of test signal for event based test system
- Patent number 6,404,218
- Issue date Jun 11, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Glitch detection for semiconductor test system
- Patent number 6,377,065
- Issue date Apr 23, 2002
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Delta time event based test system
- Patent number 6,360,343
- Issue date Mar 19, 2002
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING
Information Patent Grant
Event based test system data memory compression
- Patent number 6,226,765
- Issue date May 1, 2001
- Advantest Corp.
- Anthony Le
- G01 - MEASURING TESTING
Information Patent Grant
Pattern data compression and decompression for semiconductor test s...
- Patent number 5,883,906
- Issue date Mar 16, 1999
- Advantest Corp.
- James Alan Turnquist
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Event based IC test system
- Publication number 20030217345
- Publication date Nov 20, 2003
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system storing pin calibration data in non-volat...
- Publication number 20030110427
- Publication date Jun 12, 2003
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system with time critical sequence generation us...
- Publication number 20020157053
- Publication date Oct 24, 2002
- Leon Lee Chen
- G01 - MEASURING TESTING

James Alan Turnquist

Person

Patents Grantslast 30 patents

Event based IC test system

Event based semiconductor test system

Apparatus and method for successively generating an event to establ...

Data failure memory compaction for semiconductor test system

Event based test system storing pin calibration data in non-volatil...

Semiconductor test system supporting multiple virtual logic testers

Event based semiconductor test system

Multiple end of test signal for event based test system

Glitch detection for semiconductor test system

Delta time event based test system

Event based test system data memory compression

Pattern data compression and decompression for semiconductor test s...

Patents Applicationslast 30 patents

Event based IC test system

Semiconductor test system storing pin calibration data in non-volat...

Semiconductor test system with time critical sequence generation us...