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James C. Wyant
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Pixelated phase-mask interferometer
Patent number
7,230,717
Issue date
Jun 12, 2007
4D Technology Corporation
Neal J. Brock
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous phase-shifting fizeau interferometer
Patent number
7,230,718
Issue date
Jun 12, 2007
4D Technology Corporation
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous phase-shifting Fizeau interferometer
Patent number
7,057,738
Issue date
Jun 6, 2006
A D Technology Corporation
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Common optical-path testing of high-numerical-aperture wavefronts
Patent number
7,057,737
Issue date
Jun 6, 2006
4D Technology Corporation
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for absolute optical measurement of entire sur...
Patent number
5,502,566
Issue date
Mar 26, 1996
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing an optical window with a small wedge angle
Patent number
5,398,112
Issue date
Mar 14, 1995
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Two-wavelength phase-shifting interferometer and method
Patent number
4,832,489
Issue date
May 23, 1989
Wyko Corporation
James C. Wyant
G01 - MEASURING TESTING
Information
Patent Grant
Optical profiler using improved phase shifting interferometry
Patent number
4,639,139
Issue date
Jan 27, 1987
Wyko Corporation
James C. Wyant
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Simultaneous phase-shifting fizeau interferometer
Publication number
20060203251
Publication date
Sep 14, 2006
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Application
Common optical-path testing of high-numerical-aperture wavefronts
Publication number
20050046863
Publication date
Mar 3, 2005
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Application
Simultaneous phase-shifting fizeau interferometer
Publication number
20050046864
Publication date
Mar 3, 2005
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Application
Pixelated phase-mask interferometer
Publication number
20050046865
Publication date
Mar 3, 2005
Neal J. Brock
G01 - MEASURING TESTING