James E. HOPKINS

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fixture assembly for testing surface emitting laser diodes and test...
- Patent number 10,965,096
- Issue date Mar 30, 2021
- CHROMA ATE INC.
- James E. Hopkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixture assembly for testing edge-emitting laser diodes and testing...
- Patent number 10,903,618
- Issue date Jan 26, 2021
- CHROMA ATE INC.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Measurement fixture for a battery cell
- Patent number 9,954,255
- Issue date Apr 24, 2018
- Chroma Ate Inc.
- James E. Hopkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing system-in-package devices
- Patent number 7,545,158
- Issue date Jun 9, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing system-in-package devices
- Patent number 7,535,214
- Issue date May 19, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuits of an apparatus for testing micro SD devices
- Patent number 7,518,357
- Issue date Apr 14, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing system-in-package devices
- Patent number 7,518,356
- Issue date Apr 14, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Test circuits of an apparatus for testing system-in-package devices
- Patent number 7,514,914
- Issue date Apr 7, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing micro SD devices using test circuits
- Patent number 7,489,156
- Issue date Feb 10, 2009
- Chruma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing plurality of system-in-package devices using plu...
- Patent number 7,489,155
- Issue date Feb 10, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing micro SD devices using each test circuits
- Patent number 7,443,190
- Issue date Oct 28, 2008
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing electronic components
- Patent number 7,388,390
- Issue date Jun 17, 2008
- Telco Testing Systems LLC
- Roger Brueckner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and system for testing electronic components
- Patent number 7,262,616
- Issue date Aug 28, 2007
- Telco Testing Systems LLC
- Roger Brueckner
- G01 - MEASURING TESTING
Information Patent Grant
Lead coplanarity inspection apparatus and method thereof
- Patent number 5,563,703
- Issue date Oct 8, 1996
- Motorola, Inc.
- Christopher J. Lebeau
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
FIXTURE ASSEMBLY FOR TESTING EDGE-EMITTING LASER DIODES AND TESTING...
- Publication number 20200303895
- Publication date Sep 24, 2020
- CHROMA ATE INC.
- James E. Hopkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIXTURE ASSEMBLY FOR TESTING SURFACE EMITTING LASER DIODES AND TEST...
- Publication number 20200303894
- Publication date Sep 24, 2020
- CHROMA ATE INC.
- James E. Hopkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT FIXTURE FOR A BATTERY CELL
- Publication number 20170108326
- Publication date Apr 20, 2017
- CHROMA ATE INC.
- James E. HOPKINS
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252312
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing micro SD devices
- Publication number 20080252323
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252319
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing micro SD devices
- Publication number 20080252321
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing system-in-package devices
- Publication number 20080252313
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252314
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252317
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing micro SD devices
- Publication number 20080252320
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing system-in-package devices
- Publication number 20080252322
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING MICRO SD DEVICES USING EACH TEST CIRCUITS
- Publication number 20080252318
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS
- Publication number 20070271058
- Publication date Nov 22, 2007
- TELCO TESTING SYSTEMS, LLC
- Roger Brueckner
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND SYSTEM FOR TESTING ELECTRONIC COMPONENTS
- Publication number 20070159197
- Publication date Jul 12, 2007
- Telco Testing Systems LLC
- Roger Brueckner
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detection of contaminant particles or comp...
- Publication number 20060066846
- Publication date Mar 30, 2006
- TELCO TESTING SYSTEMS, LLC
- Ching-Too Chen
- G01 - MEASURING TESTING

James E. HOPKINS

Person

Patents Grantslast 30 patents

Fixture assembly for testing surface emitting laser diodes and test...

Fixture assembly for testing edge-emitting laser diodes and testing...

Measurement fixture for a battery cell

Method for testing system-in-package devices

Apparatus for testing system-in-package devices

Test circuits of an apparatus for testing micro SD devices

Apparatus for testing system-in-package devices

Test circuits of an apparatus for testing system-in-package devices

Method for testing micro SD devices using test circuits

Method for testing plurality of system-in-package devices using plu...

Method for testing micro SD devices using each test circuits

Method for testing electronic components

Apparatus, method and system for testing electronic components

Lead coplanarity inspection apparatus and method thereof

Patents Applicationslast 30 patents

FIXTURE ASSEMBLY FOR TESTING EDGE-EMITTING LASER DIODES AND TESTING...

FIXTURE ASSEMBLY FOR TESTING SURFACE EMITTING LASER DIODES AND TEST...

MEASUREMENT FIXTURE FOR A BATTERY CELL

Apparatus for testing system-in-package devices

Method for testing micro SD devices

Apparatus for testing system-in-package devices

Apparatus for testing micro SD devices

Method for testing system-in-package devices

Apparatus for testing system-in-package devices

Apparatus for testing system-in-package devices

Apparatus for testing micro SD devices

Method for testing system-in-package devices

METHOD FOR TESTING MICRO SD DEVICES USING EACH TEST CIRCUITS

METHOD FOR TESTING ELECTRONIC COMPONENTS

APPARATUS, METHOD AND SYSTEM FOR TESTING ELECTRONIC COMPONENTS

Apparatus and method for detection of contaminant particles or comp...