James E. Millerd

Person

Aliso Viejo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometry with pixelated color discriminating elements combine...
- Patent number 11,353,316
- Issue date Jun 7, 2022
- Onto Innovation Inc.
- Neal Brock
- G01 - MEASURING TESTING
Information Patent Grant
On-axis dynamic interferometer and optical imaging systems employin...
- Patent number 11,262,191
- Issue date Mar 1, 2022
- Onto Innovation Inc.
- James Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Single snap-shot fringe projection system
- Patent number 9,958,251
- Issue date May 1, 2018
- AD TECHNOLOGY CORPORATION
- Neal Brock
- G01 - MEASURING TESTING
Information Patent Grant
Single-step interferometric radius-of-curvature measurements utiliz...
- Patent number 9,857,169
- Issue date Jan 2, 2018
- 4D Technology Corporation
- Michael North Morris
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 8,351,048
- Issue date Jan 8, 2013
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous frequency-shift mechanism in fizeau interferometer
- Patent number 8,345,258
- Issue date Jan 1, 2013
- 4 D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 7,777,895
- Issue date Aug 17, 2010
- 4D Technology Corporation
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronous frequency-shift mechanism in Fizeau interferometer
- Patent number 7,675,628
- Issue date Mar 9, 2010
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Patent number 7,298,497
- Issue date Nov 20, 2007
- MetroLaser, Inc.
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Pixelated phase-mask interferometer
- Patent number 7,230,717
- Issue date Jun 12, 2007
- 4D Technology Corporation
- Neal J. Brock
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shifting fizeau interferometer
- Patent number 7,230,718
- Issue date Jun 12, 2007
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Patent number 7,170,611
- Issue date Jan 30, 2007
- MetroLaser, Inc.
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Calibration and error correction in multi-channel imaging
- Patent number 7,079,251
- Issue date Jul 18, 2006
- 4D Technology Corporation
- James E. Millerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous phase-shifting Fizeau interferometer
- Patent number 7,057,738
- Issue date Jun 6, 2006
- A D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Common optical-path testing of high-numerical-aperture wavefronts
- Patent number 7,057,737
- Issue date Jun 6, 2006
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Patent number 6,552,808
- Issue date Apr 22, 2003
- MetroLaser, Inc.
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Patent number 6,304,330
- Issue date Oct 16, 2001
- MetroLaser, Inc.
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyned self-mixing laser diode vibrometer
- Patent number 5,838,439
- Issue date Nov 17, 1998
- De Yu Zang
- G01 - MEASURING TESTING
Information Patent Grant
Remote measurement of near-surface physical properties using optica...
- Patent number 5,682,236
- Issue date Oct 28, 1997
- Metrolaser
- James Davis Trolinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LINEAR-CARRIER PHASE-MASK INTERFEROMETER
- Publication number 20100309476
- Publication date Dec 9, 2010
- 4D TECHNOLOGY CORPORATION
- JAMES E. MILLERD
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER
- Publication number 20100134801
- Publication date Jun 3, 2010
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Synchronous frequency-shift mechanism in Fizeau interferometer
- Publication number 20080062428
- Publication date Mar 13, 2008
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Linear-carrier phase-mask interferometer
- Publication number 20070211256
- Publication date Sep 13, 2007
- 4D TECHNOLOGY CORPORATION
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simultaneous phase-shifting fizeau interferometer
- Publication number 20060203251
- Publication date Sep 14, 2006
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Publication number 20060132795
- Publication date Jun 22, 2006
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Calibration and error correction in multi-channel imaging
- Publication number 20050083531
- Publication date Apr 21, 2005
- James E. Millerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Common optical-path testing of high-numerical-aperture wavefronts
- Publication number 20050046863
- Publication date Mar 3, 2005
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous phase-shifting fizeau interferometer
- Publication number 20050046864
- Publication date Mar 3, 2005
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Pixelated phase-mask interferometer
- Publication number 20050046865
- Publication date Mar 3, 2005
- Neal J. Brock
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Publication number 20030053071
- Publication date Mar 20, 2003
- Millerd E. James
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
- Publication number 20020003628
- Publication date Jan 10, 2002
- Millerd E. James
- G01 - MEASURING TESTING

James E. Millerd

Person

Patents Grantslast 30 patents

Interferometry with pixelated color discriminating elements combine...

On-axis dynamic interferometer and optical imaging systems employin...

Single snap-shot fringe projection system

Single-step interferometric radius-of-curvature measurements utiliz...

Linear-carrier phase-mask interferometer

Synchronous frequency-shift mechanism in fizeau interferometer

Linear-carrier phase-mask interferometer

Synchronous frequency-shift mechanism in Fizeau interferometer

Methods and apparatus for splitting, imaging, and measuring wavefro...

Pixelated phase-mask interferometer

Simultaneous phase-shifting fizeau interferometer

Methods and apparatus for splitting, imaging, and measuring wavefro...

Calibration and error correction in multi-channel imaging

Simultaneous phase-shifting Fizeau interferometer

Common optical-path testing of high-numerical-aperture wavefronts

Methods and apparatus for splitting, imaging, and measuring wavefro...

Methods and apparatus for splitting, imaging, and measuring wavefro...

Heterodyned self-mixing laser diode vibrometer

Remote measurement of near-surface physical properties using optica...

Patents Applicationslast 30 patents

LINEAR-CARRIER PHASE-MASK INTERFEROMETER

SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER

Synchronous frequency-shift mechanism in Fizeau interferometer

Linear-carrier phase-mask interferometer

Simultaneous phase-shifting fizeau interferometer

Methods and apparatus for splitting, imaging, and measuring wavefro...

Calibration and error correction in multi-channel imaging

Common optical-path testing of high-numerical-aperture wavefronts

Simultaneous phase-shifting fizeau interferometer

Pixelated phase-mask interferometer

Methods and apparatus for splitting, imaging, and measuring wavefro...

Methods and apparatus for splitting, imaging, and measuring wavefro...