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James F. Belcher
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Plano, TX, US
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last 30 patents
Information
Patent Grant
Chemical polishing of barium strontium titanate
Patent number
6,270,688
Issue date
Aug 7, 2001
Raytheon Company
James F. Belcher
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Grant
Method and structure for etching a thin film perovskite layer
Patent number
6,177,351
Issue date
Jan 23, 2001
Texas Instruments Incorporated
Howard R. Beratan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for making a conductive polymer coating
Patent number
6,083,557
Issue date
Jul 4, 2000
Raytheon Company
James F. Belcher
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Infrared-sensitive conductive-polymer coating
Patent number
6,080,987
Issue date
Jun 27, 2000
Raytheon Company
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Infrared detector array with an elevated thin film
Patent number
5,959,298
Issue date
Sep 28, 1999
Texas Instruments Incorporated
James F. Belcher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and structure for forming an array of thermal sensors
Patent number
5,792,377
Issue date
Aug 11, 1998
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure for forming an array of thermal sensors
Patent number
5,746,930
Issue date
May 5, 1998
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Retractable probe system with in situ fabrication environment proce...
Patent number
5,746,835
Issue date
May 5, 1998
Texas Instruments Incorporated
Terry R. Turner
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,737,818
Issue date
Apr 14, 1998
Texas Instrument Incorporated
Steven N. Frank
G01 - MEASURING TESTING
Information
Patent Grant
Retractable probe system with in situ fabrication environment proce...
Patent number
5,716,878
Issue date
Feb 10, 1998
Texas Instruments Incorporated
Terry R. Turner
G01 - MEASURING TESTING
Information
Patent Grant
Method of minimizing surface effects in thin ferroelectrics
Patent number
5,705,041
Issue date
Jan 6, 1998
Texas Instruments Incorporated
James F. Belcher
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,696,002
Issue date
Dec 9, 1997
Texas Instruments Incorporated
Steven N. Frank
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual etching of ceramic materials with an elevated thin film
Patent number
5,679,267
Issue date
Oct 21, 1997
Texas Instruments Incorporated
James F. Belcher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor structure for fabrication of a thermal sensor
Patent number
5,654,580
Issue date
Aug 5, 1997
Texas Instruments Incorporated
Howard R. Beratan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Etching of ceramic materials with an elevated thin film
Patent number
5,653,892
Issue date
Aug 5, 1997
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method including dry etching techniques for forming a...
Patent number
5,647,946
Issue date
Jul 15, 1997
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,646,066
Issue date
Jul 8, 1997
Texas Instruments Incorporated
Steven N. Frank
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Etching of ceramic materials with an elevated thin film
Patent number
5,631,467
Issue date
May 20, 1997
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method including dry etching techniques for forming a...
Patent number
5,626,773
Issue date
May 6, 1997
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Infrared sensing device
Patent number
5,623,158
Issue date
Apr 22, 1997
Texas Instruments Incorporated
Steven N. Frank
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical coat reticulation post hybridization
Patent number
5,607,600
Issue date
Mar 4, 1997
Texas Instruments Incorporated
James F. Belcher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,608,254
Issue date
Mar 4, 1997
Texas Instruments Incorporated
Steven N. Frank
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating focal plane array
Patent number
5,604,977
Issue date
Feb 25, 1997
Texas Instruments Incorporated
James E. Robinson
G01 - MEASURING TESTING
Information
Patent Grant
Method for etching through a substrate to an attached coating
Patent number
5,603,848
Issue date
Feb 18, 1997
Texas Instruments Incorporated
Howard R. Beratan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Multiple level mask for patterning of ceramic materials
Patent number
5,587,090
Issue date
Dec 24, 1996
Texas Instruments Incorporated
James F. Belcher
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,577,309
Issue date
Nov 26, 1996
Texas Instruments Incorporated
Steven N. Frank
G01 - MEASURING TESTING
Information
Patent Grant
Electrical contact to the common electrode of an infrared detector...
Patent number
5,565,682
Issue date
Oct 15, 1996
Texas Instruments Incorporated
Steven N. Frank
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming electrical contact to the optical coating of an...
Patent number
5,552,326
Issue date
Sep 3, 1996
Texas Instruments Incorporated
Steven N. Frank
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Etching pyroelectric devices post ion milling
Patent number
5,520,299
Issue date
May 28, 1996
Texas Instruments Incorporated
James F. Belcher
G01 - MEASURING TESTING
Information
Patent Grant
Dual etching of ceramic materials
Patent number
5,466,332
Issue date
Nov 14, 1995
Texas Instruments Incorporated
Robert A. Owen
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES