James Francis Elliott

Person

Rochester, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Heterojunction bipolar transistors with undercut extrinsic base reg...
- Patent number 11,362,201
- Issue date Jun 14, 2022
- GLOBALFOUNDRIES U.S. INC.
- Sarah McTaggart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heterojunction bipolar transistors with a controlled undercut forme...
- Patent number 10,217,852
- Issue date Feb 26, 2019
- GLOBALFOUNDRIES Inc.
- Qizhi Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Waveguide devices with supporting anchors
- Patent number 9,274,277
- Issue date Mar 1, 2016
- GLOBALFOUNDRIES Inc.
- Brennan J. Brown
- G02 - OPTICS
Information Patent Grant
Bipolar junction transistors with reduced base-collector junction c...
- Patent number 9,240,448
- Issue date Jan 19, 2016
- GLOBALFOUNDRIES Inc.
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bipolar junction transistors with self-aligned terminals
- Patent number 9,231,087
- Issue date Jan 5, 2016
- GLOBALFOUNDRIES Inc.
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of a high aspect ratio trench in a semiconductor substrat...
- Patent number 9,224,843
- Issue date Dec 29, 2015
- GLOBALFOUNDRIES Inc.
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bipolar junction transistors with reduced base-collector junction c...
- Patent number 9,093,491
- Issue date Jul 28, 2015
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of a high aspect ratio trench in a semiconductor substrat...
- Patent number 9,059,234
- Issue date Jun 16, 2015
- International Business Machines Corporation
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 8,236,580
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 7,957,917
- Issue date Jun 7, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit structure, design structure, and method having i...
- Patent number 7,927,963
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Brennan J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 7,888,142
- Issue date Feb 15, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit structure, design structure, and method having i...
- Patent number 7,804,151
- Issue date Sep 28, 2010
- International Business Machines Corporation
- Brennan J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer spacer with inhibited recess/undercut and method for fa...
- Patent number 7,446,007
- Issue date Nov 4, 2008
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor metal contamination reduction for ultra-thin gate die...
- Patent number 7,342,290
- Issue date Mar 11, 2008
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bilayer ultra-thin gate dielectric and process for semiconductor me...
- Patent number 6,838,396
- Issue date Jan 4, 2005
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data storage apparatus employing a flexible magnetic disk
- Patent number 3,990,111
- Issue date Nov 2, 1976
- International Business Machines Corporation
- James Francis Elliott
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
HETEROJUNCTION BIPOLAR TRANSISTORS WITH UNDERCUT EXTRINSIC BASE REG...
- Publication number 20220190145
- Publication date Jun 16, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Sarah McTaggart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEGUIDE DEVICES WITH SUPPORTING ANCHORS
- Publication number 20150331183
- Publication date Nov 19, 2015
- International Business Machines Corporation
- Brennan J. BROWN
- G02 - OPTICS
Information Patent Application
BIPOLAR JUNCTION TRANSISTORS WITH REDUCED BASE-COLLECTOR JUNCTION C...
- Publication number 20150311283
- Publication date Oct 29, 2015
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIPOLAR JUNCTION TRANSISTORS WITH SELF-ALIGNED TERMINALS
- Publication number 20150214344
- Publication date Jul 30, 2015
- International Business Machines Corporation
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF A HIGH ASPECT RATIO TRENCH IN A SEMICONDUCTOR SUBSTRAT...
- Publication number 20150206959
- Publication date Jul 23, 2015
- International Business Machines Corporation
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIPOLAR JUNCTION TRANSISTORS WITH SELF-ALIGNED TERMINALS
- Publication number 20150123245
- Publication date May 7, 2015
- International Business Machines Corporation
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF A HIGH ASPECT RATIO TRENCH IN A SEMICONDUCTOR SUBSTRAT...
- Publication number 20150108549
- Publication date Apr 23, 2015
- International Business Machines Corporation
- John J. Benoit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIPOLAR JUNCTION TRANSISTORS WITH REDUCED BASE-COLLECTOR JUNCTION C...
- Publication number 20140151852
- Publication date Jun 5, 2014
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20110086442
- Publication date Apr 14, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Structure, Design Structure, and Method Having I...
- Publication number 20100032796
- Publication date Feb 11, 2010
- Brennan J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Structure, Design Structure, and Method Having I...
- Publication number 20100035403
- Publication date Feb 11, 2010
- Brennan J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20090087928
- Publication date Apr 2, 2009
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20090088984
- Publication date Apr 2, 2009
- Jay Sanford Burnham
- G01 - MEASURING TESTING
Information Patent Application
MULTI-LAYER SPACER WITH INHIBITED RECESS/UNDERCUT AND METHOD FOR FA...
- Publication number 20080116493
- Publication date May 22, 2008
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor metal contamination reduction for ultra-thin gate die...
- Publication number 20050112888
- Publication date May 26, 2005
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BILAYER ULTRA-THIN GATE DIELECTRIC AND PROCESS FOR SEMICONDUCTOR ME...
- Publication number 20040192065
- Publication date Sep 30, 2004
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS

James Francis Elliott

Person

Patents Grantslast 30 patents

Heterojunction bipolar transistors with undercut extrinsic base reg...

Heterojunction bipolar transistors with a controlled undercut forme...

Waveguide devices with supporting anchors

Bipolar junction transistors with reduced base-collector junction c...

Bipolar junction transistors with self-aligned terminals

Formation of a high aspect ratio trench in a semiconductor substrat...

Bipolar junction transistors with reduced base-collector junction c...

Formation of a high aspect ratio trench in a semiconductor substrat...

Copper contamination detection method and system for monitoring cop...

Copper contamination detection method and system for monitoring cop...

Integrated circuit structure, design structure, and method having i...

Copper contamination detection method and system for monitoring cop...

Integrated circuit structure, design structure, and method having i...

Multi-layer spacer with inhibited recess/undercut and method for fa...

Semiconductor metal contamination reduction for ultra-thin gate die...

Bilayer ultra-thin gate dielectric and process for semiconductor me...

Data storage apparatus employing a flexible magnetic disk

Patents Applicationslast 30 patents

HETEROJUNCTION BIPOLAR TRANSISTORS WITH UNDERCUT EXTRINSIC BASE REG...

WAVEGUIDE DEVICES WITH SUPPORTING ANCHORS

BIPOLAR JUNCTION TRANSISTORS WITH REDUCED BASE-COLLECTOR JUNCTION C...

BIPOLAR JUNCTION TRANSISTORS WITH SELF-ALIGNED TERMINALS

FORMATION OF A HIGH ASPECT RATIO TRENCH IN A SEMICONDUCTOR SUBSTRAT...

BIPOLAR JUNCTION TRANSISTORS WITH SELF-ALIGNED TERMINALS

FORMATION OF A HIGH ASPECT RATIO TRENCH IN A SEMICONDUCTOR SUBSTRAT...

BIPOLAR JUNCTION TRANSISTORS WITH REDUCED BASE-COLLECTOR JUNCTION C...

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

Integrated Circuit Structure, Design Structure, and Method Having I...

Integrated Circuit Structure, Design Structure, and Method Having I...

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

MULTI-LAYER SPACER WITH INHIBITED RECESS/UNDERCUT AND METHOD FOR FA...

Semiconductor metal contamination reduction for ultra-thin gate die...

BILAYER ULTRA-THIN GATE DIELECTRIC AND PROCESS FOR SEMICONDUCTOR ME...