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James Hubner
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Gainesville, FL, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for measuring strain using a luminescent photo...
Patent number
6,943,869
Issue date
Sep 13, 2005
Resesarch Foundation, Inc.
James P. Hubner
G01 - MEASURING TESTING
Information
Patent Grant
System, method, and coating for strain analysis
Patent number
6,327,030
Issue date
Dec 4, 2001
University of Florida
Peter Ifju
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Essentially thickness independent single layer photoelastic coating
Publication number
20060192177
Publication date
Aug 31, 2006
Leishan Chen
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring strain using a luminescent photo...
Publication number
20060007424
Publication date
Jan 12, 2006
James P. Hubner
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring strain using a luminescent photo...
Publication number
20040066503
Publication date
Apr 8, 2004
James P. Hubner
G01 - MEASURING TESTING
Information
Patent Application
System, method, and coating for strain analysis
Publication number
20010008445
Publication date
Jul 19, 2001
Peter Ifju
G01 - MEASURING TESTING