James M. Kronrod

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Moraga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring the thickness or temperature of a c...
- Patent number 7,002,360
- Issue date Feb 21, 2006
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring the power consumed by a circuit on...
- Patent number 6,972,556
- Issue date Dec 6, 2005
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring the power consumed by a circuit on...
- Patent number 6,861,834
- Issue date Mar 1, 2005
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring the thickness or temperature of a c...
- Patent number 6,714,026
- Issue date Mar 30, 2004
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Display Systems Having Improved Power Profiles
- Publication number 20140307011
- Publication date Oct 16, 2014
- Dolby Laboratories Licensing Corporation
- Ajit Ninan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for measuring the power consumed by a circuit on...
- Publication number 20040257063
- Publication date Dec 23, 2004
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Application
System and method for measuring the thickness or temperature of a c...
- Publication number 20040196056
- Publication date Oct 7, 2004
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Application
System and method for measuring the thickness or temperature of a c...
- Publication number 20030001593
- Publication date Jan 2, 2003
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING
Information Patent Application
System and method for measuring the power consumed by a circuit on...
- Publication number 20020050827
- Publication date May 2, 2002
- Broadcom Corporation
- James M. Kronrod
- G01 - MEASURING TESTING