James N. Liu

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring radical particle concentration using mass spectrometry
- Patent number 12,265,057
- Issue date Apr 1, 2025
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring radical particle concentration using mass spectrometry
- Patent number 11,971,386
- Issue date Apr 30, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and circuits for restoration of a drooped DC signal
- Patent number 6,242,961
- Issue date Jun 5, 2001
- Altima Communication, Inc.
- James Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring noise figure and y-factor
- Patent number 5,191,294
- Issue date Mar 2, 1993
- Wiltron Company
- Martin I. Grace
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20240264116
- Publication date Aug 8, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Feedback Control in Plasma Processing Using...
- Publication number 20230369033
- Publication date Nov 16, 2023
- MKS Instruments, Inc.
- Keith K. Koai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20220196597
- Publication date Jun 23, 2022
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS