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James R. Hyatt
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Madison, WI, US
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Patents Grants
last 30 patents
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Patent Grant
Feedback circuit for output control in a semiconductor X-ray detector
Patent number
7,554,091
Issue date
Jun 30, 2009
Thermo Electron Scientific Instruments LLC
William E. Drummond
G01 - MEASURING TESTING
Information
Patent Grant
Multifunctional fourier transform infrared spectrometer system
Patent number
6,667,808
Issue date
Dec 23, 2003
Thermo Electron Scientific Instruments Corporation
Todd R. Clermont
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically calibrating the gain and off...
Patent number
4,958,139
Issue date
Sep 18, 1990
Nicolet Instrument Corporation
James R. Hyatt
G01 - MEASURING TESTING
Information
Patent Grant
Digital data acquisition apparatus
Patent number
4,553,109
Issue date
Nov 12, 1985
Nicolet Instrument Corporation
James R. Hyatt
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Feedback Circuit for Output Control in a Semiconductor X-Ray Detector
Publication number
20080116384
Publication date
May 22, 2008
William E. Drummond
G01 - MEASURING TESTING
Information
Patent Application
Multifunctional fourier transform infrared spectrometer system
Publication number
20010035957
Publication date
Nov 1, 2001
Todd R. Clermont
G01 - MEASURING TESTING