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James Wylde
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Oak Leaf, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for detecting organic and inorganic explosives
Patent number
9,804,141
Issue date
Oct 31, 2017
1ST Detect Corporation
Guido Fridolin Verbeck
G01 - MEASURING TESTING
Information
Patent Grant
Introducing an analyte into a chemical analyzer
Patent number
9,599,547
Issue date
Mar 21, 2017
1ST Detect Corporation
David Rafferty
G01 - MEASURING TESTING
Information
Patent Grant
Ionization within ion trap using photoionization and electron ioniz...
Patent number
9,570,282
Issue date
Feb 14, 2017
1ST Detect Corporation
Abrar Riaz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass dependent automatic gain control for mass spectrometer
Patent number
9,472,388
Issue date
Oct 18, 2016
1ST Detect Corporation
James Wylde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Preconcentrating a sample in a preconcentrator evacuated to substan...
Patent number
9,451,364
Issue date
Sep 20, 2016
1ST Detect Corporation
David Rafferty
A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information
Patent Grant
Evacuating a sample chamber
Patent number
9,312,112
Issue date
Apr 12, 2016
1ST Detect Corporation
David Rafferty
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating mass spectrometers
Patent number
9,299,545
Issue date
Mar 29, 2016
1ST Detect Corporation
David Rafferty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrum noise cancellation by alternating inverted synchronou...
Patent number
9,196,467
Issue date
Nov 24, 2015
1ST Detect Corporation
David Rafferty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic gain control with defocusing lens
Patent number
9,035,244
Issue date
May 19, 2015
1ST Detect Corporation
David Rafferty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for calibrating mass spectrometers
Patent number
8,975,573
Issue date
Mar 10, 2015
1ST Detect Corporation
David Rafferty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass dependent automatic gain control for mass spectrometer
Patent number
8,969,794
Issue date
Mar 3, 2015
1ST Detect Corporation
James Wylde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Introducing an analyte into a chemical analyzer
Patent number
8,784,737
Issue date
Jul 22, 2014
1ST Detect Corporation
David Rafferty
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETECTING ORGANIC AND INORGANIC EXPLOSIVES
Publication number
20150330961
Publication date
Nov 19, 2015
1ST DETECT CORPORATION
Guido Fridolin VERBECK
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS
Publication number
20150235826
Publication date
Aug 20, 2015
1ST DETECT CORPORATION
David Rafferty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER
Publication number
20150228468
Publication date
Aug 13, 2015
1ST DETECT CORPORATION
James Wylde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTRODUCING AN ANALYTE INTO A CHEMICAL ANALYZER
Publication number
20150010442
Publication date
Jan 8, 2015
David Rafferty
G01 - MEASURING TESTING
Information
Patent Application
MASS DEPENDENT AUTOMATIC GAIN CONTROL FOR MASS SPECTROMETER
Publication number
20140299760
Publication date
Oct 9, 2014
1ST DETECT CORPORATION
James Wylde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZ...
Publication number
20140264010
Publication date
Sep 18, 2014
1ST DETECT CORPORATION
Abrar RIAZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS
Publication number
20140252215
Publication date
Sep 11, 2014
1ST DETECT CORPORATION
David Rafferty
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTRUM NOISE CANCELLATION BY ALTERNATING INVERTED SYNCHRONOU...
Publication number
20140252220
Publication date
Sep 11, 2014
1st Detect Corporation
David Rafferty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC GAIN CONTROL WITH DEFOCUSING LENS
Publication number
20140252222
Publication date
Sep 11, 2014
1ST DETECT CORPORATION
David RAFFERTY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCED PRESSURE LIQUID SAMPLING
Publication number
20140190245
Publication date
Jul 10, 2014
David Rafferty
G01 - MEASURING TESTING
Information
Patent Application
PRECONCENTRATING A SAMPLE
Publication number
20120270334
Publication date
Oct 25, 2012
1ST DETECT CORPORATION
Pedro Ojeda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Introducing An Analyte Into A Chemical Analyzer
Publication number
20120223226
Publication date
Sep 6, 2012
1ST DETECT CORPORATION
David Rafferty
G01 - MEASURING TESTING
Information
Patent Application
Evacuating a Sample Chamber
Publication number
20120180576
Publication date
Jul 19, 2012
1ST DETECT CORPORATION
David Rafferty
G01 - MEASURING TESTING
Information
Patent Application
NANO-ENHANCED SMART PANEL
Publication number
20090047453
Publication date
Feb 19, 2009
SMART NANOMATERIALS, LLC
Robert Folaron
B61 - RAILWAYS
Information
Patent Application
NANO-ENHANCED MODULARLY CONSTRUCTED COMPOSITE PANEL
Publication number
20090047502
Publication date
Feb 19, 2009
SMART NANOMATERIALS, LLC
Robert Folaron
B32 - LAYERED PRODUCTS
Information
Patent Application
NANO-ENHANCED MODULARLY CONSTRUCTED CONTAINER
Publication number
20090045195
Publication date
Feb 19, 2009
SMART NANOMATERIALS, LLC
Tobin Djerf
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL