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Jan Hendrikse
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Whitby, CA
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Patents Grants
last 30 patents
Information
Patent Grant
In situ chemical transformation and ionization of inorganic perchlo...
Patent number
11,959,846
Issue date
Apr 16, 2024
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In situ chemical transformation and ionization of inorganic perchlo...
Patent number
10,578,526
Issue date
Mar 3, 2020
Smiths Detection Montreal Inc.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dopants for the detection of nitrates
Patent number
10,345,264
Issue date
Jul 9, 2019
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion funnel for efficient transmission of low mass-to-charge ratio i...
Patent number
10,109,471
Issue date
Oct 23, 2018
Smith Detection, Inc.
Vadym Berkout
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Concentric APCI surface ionization ion source, ion guide, and metho...
Patent number
9,972,482
Issue date
May 15, 2018
Smiths Detection Montreal Inc.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Concentric APCI surface ionization ion source, ion guide, and metho...
Patent number
9,728,389
Issue date
Aug 8, 2017
Smiths Detection Montreal Inc.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion funnel for efficient transmission of low mass-to-charge ratio i...
Patent number
9,564,305
Issue date
Feb 7, 2017
Smiths Detection Inc.
Vadym Berkout
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid phase micro extraction (SPME) vacuum inlet
Patent number
9,134,208
Issue date
Sep 15, 2015
Smiths Detection Montreal Inc.
Jan Hendrikse
G01 - MEASURING TESTING
Information
Patent Grant
Systems, devices, and methods for sample analysis using mass spectr...
Patent number
9,048,077
Issue date
Jun 2, 2015
Smiths Detection Montreal Inc.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for generating ions for mass analysis
Patent number
7,750,312
Issue date
Jul 6, 2010
DH Technologies Development Pte. Ltd.
John J. Corr
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR IONIZING A SURFACE
Publication number
20210104393
Publication date
Apr 8, 2021
1ST DETECT CORPORATION
Jan HENDRIKSE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TRANSFERRING IONS TO A MASS SPECTROMETER
Publication number
20200335318
Publication date
Oct 22, 2020
1ST DETECT CORPORATION
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN SITU CHEMICAL TRANSFORMATION AND IONIZATION OF INORGANIC PERCHLO...
Publication number
20200271557
Publication date
Aug 27, 2020
SMITHS DETECTION MONTREAL INC.
Jan HENDRIKSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DOPANTS FOR THE DETECTION OF NITRATES
Publication number
20180136165
Publication date
May 17, 2018
Jan Hendrikse
G01 - MEASURING TESTING
Information
Patent Application
CONCENTRIC APCI SURFACE IONIZATION ION SOURCE, ION GUIDE, AND METHO...
Publication number
20170365455
Publication date
Dec 21, 2017
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONCENTRIC APCI SURFACE IONIZATION ION SOURCE, ION GUIDE, AND METHO...
Publication number
20160268116
Publication date
Sep 15, 2016
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN SITU CHEMICAL TRANSFORMATION AND IONIZATION OF INORGANIC PERCHLO...
Publication number
20160161379
Publication date
Jun 9, 2016
SMITHS DETECTION MONTREAL INC.
Jan HENDRIKSE
G01 - MEASURING TESTING
Information
Patent Application
ION FUNNEL FOR EFFICIENT TRANSMISSION OF LOW MASS-TO-CHARGE RATIO I...
Publication number
20160035556
Publication date
Feb 4, 2016
SMITHS DETECTION INC.
Vadym Berkout
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SURFACE IONIZATION SOURCE
Publication number
20150371807
Publication date
Dec 24, 2015
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR SAMPLE ANALYSIS USING MASS SPECTR...
Publication number
20140339417
Publication date
Nov 20, 2014
Smiths Detection Montreal Inc.
Jan Hendrikse
G01 - MEASURING TESTING
Information
Patent Application
SOLID PHASE MICRO EXTRACTION (SPME) VACUUM INLET
Publication number
20140033835
Publication date
Feb 6, 2014
Jan Hendrikse
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Generating Ions for Mass Analysis
Publication number
20080067409
Publication date
Mar 20, 2008
Applera Corporation
John J. Corr
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sample preparation and slide plating apparatus and method
Publication number
20020086431
Publication date
Jul 4, 2002
Walter Bruce Markham
G01 - MEASURING TESTING