Jan-Wen You

Person

Taoyuang, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for identifying lens aberration sensitive pattern...
- Patent number 7,643,976
- Issue date Jan 5, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for enhancing image resolution using a modificati...
- Patent number 7,474,788
- Issue date Jan 6, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Ming Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving the critical dimension uniformity of patterned...
- Patent number 7,234,128
- Issue date Jun 19, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsai-Sheng Gau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase shift assignments for alternate PSM
- Patent number 7,175,941
- Issue date Feb 13, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Patent number 7,131,102
- Issue date Oct 31, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Patent number 7,036,108
- Issue date Apr 25, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Patent number 7,013,453
- Issue date Mar 14, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of defining forbidden pitches for a lithography exposure tool
- Patent number 6,973,636
- Issue date Dec 6, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Patent number 6,711,732
- Issue date Mar 23, 2004
- Taiwan Semiconductor Manufacturing Company
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Identifying Lens Aberration Sensitive Pattern...
- Publication number 20070203680
- Publication date Aug 30, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithography process to reduce interference
- Publication number 20070087291
- Publication date Apr 19, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tsai-Sheng Gau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for enhancing image resolution
- Publication number 20060050965
- Publication date Mar 9, 2006
- Shih-Ming Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of defining forbidden pitches for a lithography exposure tool
- Publication number 20050086629
- Publication date Apr 21, 2005
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for improving the critical dimension uniformity of patterned...
- Publication number 20050076323
- Publication date Apr 7, 2005
- Taiwan Semiconductor Manufacturing Co., LTD
- Tsai-Sheng Gau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Phase shift assignments for alternate PSM
- Publication number 20050053846
- Publication date Mar 10, 2005
- Taiwan Semicondutor Manufacturing Co.
- Jaw-Jung Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Publication number 20040168147
- Publication date Aug 26, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Publication number 20040168146
- Publication date Aug 26, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Full sized scattering bar alt-PSM technique for IC manufacturing in...
- Publication number 20040161679
- Publication date Aug 19, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chang-Ming Dai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jan-Wen You

Person

Patents Grantslast 30 patents

Method and system for identifying lens aberration sensitive pattern...

Method and system for enhancing image resolution using a modificati...

Method for improving the critical dimension uniformity of patterned...

Phase shift assignments for alternate PSM

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Method of defining forbidden pitches for a lithography exposure tool

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Patents Applicationslast 30 patents

Method and System for Identifying Lens Aberration Sensitive Pattern...

Lithography process to reduce interference

Method and system for enhancing image resolution

Method of defining forbidden pitches for a lithography exposure tool

Method for improving the critical dimension uniformity of patterned...

Phase shift assignments for alternate PSM

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Full sized scattering bar alt-PSM technique for IC manufacturing in...

Full sized scattering bar alt-PSM technique for IC manufacturing in...