Jang Jung Lee

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Atom probe tomography specimen preparation
- Patent number 11,837,435
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Line edge roughness analysis using atomic force microscopy
- Patent number 11,774,241
- Issue date Oct 3, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Shan Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,703,523
- Issue date Jul 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Line edge roughness analysis using atomic force microscopy
- Patent number 11,236,996
- Issue date Feb 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Shan Hu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor structure sample preparation...
- Patent number 11,211,271
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Wei Hung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection systems in semiconductor metrology tools
- Patent number 11,087,956
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe tomography specimen preparation
- Patent number 11,088,036
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,079,405
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Line edge roughness analysis using atomic force microscopy
- Patent number 10,746,542
- Issue date Aug 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Shan Hu
- G01 - MEASURING TESTING
Information Patent Grant
Soft error rate (SER) reduction in advanced silicon processes
- Patent number 8,633,109
- Issue date Jan 21, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Huei Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20240395636
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20230386783
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY
- Publication number 20220107179
- Publication date Apr 7, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Shan HU
- G01 - MEASURING TESTING
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20220059318
- Publication date Feb 24, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS
- Publication number 20210366687
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FERROELECTRIC SIGNAL
- Publication number 20210349126
- Publication date Nov 11, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20210343603
- Publication date Nov 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR STRUCTURE SAMPLE PREPARATION...
- Publication number 20210057247
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY
- Publication number 20200340807
- Publication date Oct 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Shan HU
- G01 - MEASURING TESTING
Information Patent Application
LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY
- Publication number 20200096332
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Shan Hu
- G01 - MEASURING TESTING
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20200043813
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS
- Publication number 20200006033
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- G01 - MEASURING TESTING
Information Patent Application
SOFT ERROR RATE (SER) REDUCTION IN ADVANCED SILICON PROCESSES
- Publication number 20120032334
- Publication date Feb 9, 2012
- TAIWAN SEMICONDUCTOR MANUFACTURING COMAPNY, LTD.
- Yung-Huei Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Photomask cleaning using vacuum ultraviolet (VUV) light cleaning
- Publication number 20070012335
- Publication date Jan 18, 2007
- Hsiao Chih Chang
- B08 - CLEANING

Jang Jung Lee

Person

Patents Grantslast 30 patents

Atom probe tomography specimen preparation

Line edge roughness analysis using atomic force microscopy

Method and apparatus for detecting ferroelectric signal

Line edge roughness analysis using atomic force microscopy

Systems and methods for semiconductor structure sample preparation...

Detection systems in semiconductor metrology tools

Atom probe tomography specimen preparation

Method and apparatus for detecting ferroelectric signal

Line edge roughness analysis using atomic force microscopy

Soft error rate (SER) reduction in advanced silicon processes

Patents Applicationslast 30 patents

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS

METHOD AND APPARATUS FOR DETECTING FERROELECTRIC SIGNAL

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

SYSTEMS AND METHODS FOR SEMICONDUCTOR STRUCTURE SAMPLE PREPARATION...

LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY

LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS

SOFT ERROR RATE (SER) REDUCTION IN ADVANCED SILICON PROCESSES

Photomask cleaning using vacuum ultraviolet (VUV) light cleaning