January Kister

Person

Portola Valley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe on carrier architecture for vertical probe arrays
- Patent number 11,293,947
- Issue date Apr 5, 2022
- FormFactor, Inc.
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probes having decoupled electrical and mechanical d...
- Patent number 11,156,637
- Issue date Oct 26, 2021
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
MEMS probe card assembly having decoupled electrical and mechanical...
- Patent number 11,156,640
- Issue date Oct 26, 2021
- FormFactor, Inc.
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with embedded skate
- Patent number 11,054,443
- Issue date Jul 6, 2021
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe skates for electrical testing of convex pad topologies
- Patent number RE46221
- Issue date Nov 29, 2016
- MicroProbe, Inc.
- January Kister
Information Patent Grant
Probes with high current carrying capability and laser machining me...
- Patent number 9,476,911
- Issue date Oct 25, 2016
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Multiple contact probes
- Patent number 9,316,670
- Issue date Apr 19, 2016
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe retention arrangement
- Patent number 9,310,428
- Issue date Apr 12, 2016
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 9,274,143
- Issue date Mar 1, 2016
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe bonding method having improved control of bonding material
- Patent number 9,250,266
- Issue date Feb 2, 2016
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probes with offset arm and suspension structure
- Patent number 9,121,868
- Issue date Sep 1, 2015
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Layered probes with core
- Patent number 9,097,740
- Issue date Aug 4, 2015
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Multiple contact probes
- Patent number 8,988,091
- Issue date Mar 24, 2015
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe retention arrangement
- Patent number 8,907,689
- Issue date Dec 9, 2014
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch guided vertical probe array having enclosed probe flexures
- Patent number 8,829,937
- Issue date Sep 9, 2014
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical guided layered probe
- Patent number 8,723,546
- Issue date May 13, 2014
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 8,415,963
- Issue date Apr 9, 2013
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 8,324,923
- Issue date Dec 4, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe bonding method having improved control of bonding material
- Patent number 8,230,593
- Issue date Jul 31, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe skates for electrical testing of convex pad topologies
- Patent number RE43503
- Issue date Jul 10, 2012
- MicroProbe, Inc.
- January Kister
- 324 - Electricity: measuring and testing
Information Patent Grant
Probes with offset arm and suspension structure
- Patent number 8,203,353
- Issue date Jun 19, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Knee probe having reduced thickness section for control of scrub mo...
- Patent number 8,111,080
- Issue date Feb 7, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 7,952,377
- Issue date May 31, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 7,944,224
- Issue date May 17, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe cards employing probes having retaining portions for potting...
- Patent number 7,786,740
- Issue date Aug 31, 2010
- Astria Semiconductor Holdings, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probes with self-cleaning blunt skates for contacting conductive pads
- Patent number 7,759,949
- Issue date Jul 20, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Knee probe having increased scrub motion
- Patent number 7,733,101
- Issue date Jun 8, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical guided probe array providing sideways scrub motion
- Patent number 7,671,610
- Issue date Mar 2, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Knee probe having reduced thickness section for control of scrub mo...
- Patent number 7,659,739
- Issue date Feb 9, 2010
- Micro Porbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 7,649,367
- Issue date Jan 19, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe on carrier architecture for vertical probe arrays
- Publication number 20200341030
- Publication date Oct 29, 2020
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Application
Electrical test probes having decoupled electrical and mechanical d...
- Publication number 20190383857
- Publication date Dec 19, 2019
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe tip with embedded skate
- Publication number 20190293685
- Publication date Sep 26, 2019
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
MEMS Probe Card Assembly having Decoupled Electrical and Mechanical...
- Publication number 20190128924
- Publication date May 2, 2019
- Mukesh Selvaraj
- G01 - MEASURING TESTING
Information Patent Application
PROBE RETENTION ARRANGEMENT
- Publication number 20150091596
- Publication date Apr 2, 2015
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY
- Publication number 20140043054
- Publication date Feb 13, 2014
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNO...
- Publication number 20140044985
- Publication date Feb 13, 2014
- FormFactor, Inc.
- January Kister
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION
- Publication number 20130093450
- Publication date Apr 18, 2013
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL
- Publication number 20120313621
- Publication date Dec 13, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE
- Publication number 20120313660
- Publication date Dec 13, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH HIGH CURRENT CARRYING CAPABILITY AND LASER MACHINING ME...
- Publication number 20120286816
- Publication date Nov 15, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONT...
- Publication number 20110273198
- Publication date Nov 10, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION
- Publication number 20110273199
- Publication date Nov 10, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CONTACT PROBES
- Publication number 20110062978
- Publication date Mar 17, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBE RETENTION ARRANGEMENT
- Publication number 20110006796
- Publication date Jan 13, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE
- Publication number 20100289512
- Publication date Nov 18, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Knee Probe Having Reduced Thickness Section for Control of Scrub Mo...
- Publication number 20100182030
- Publication date Jul 22, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Layered Probes With Core
- Publication number 20100182031
- Publication date Jul 22, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical Guided Layered Probe
- Publication number 20100176832
- Publication date Jul 15, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Low Profile Probe Having Improved Mechanical Scrub and Reduced Cont...
- Publication number 20100109691
- Publication date May 6, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe bonding method having improved control of bonding material
- Publication number 20090293274
- Publication date Dec 3, 2009
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical Probe Array Arranged to Provide Space Transformation
- Publication number 20090201041
- Publication date Aug 13, 2009
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe array arranged to provide space transformation
- Publication number 20080252325
- Publication date Oct 16, 2008
- Microprobe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe cards employing probes having retaining portions for potting...
- Publication number 20080111572
- Publication date May 15, 2008
- Microprobe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Knee probe having reduced thickness section for control of scrub mo...
- Publication number 20080068035
- Publication date Mar 20, 2008
- Microprobe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Space transformers employing wire bonds for interconnections with f...
- Publication number 20070216432
- Publication date Sep 20, 2007
- Microprobe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Probe cards employing probes having retaining portions for potting...
- Publication number 20070132466
- Publication date Jun 14, 2007
- Microprobe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Multipath interconnect with meandering contact cantilevers
- Publication number 20060068612
- Publication date Mar 30, 2006
- January Kister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sheet metal coil spring testing connector
- Publication number 20050245142
- Publication date Nov 3, 2005
- January Kister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipath interconnect with meandering contact cantilevers
- Publication number 20050196980
- Publication date Sep 8, 2005
- January Kister
- H01 - BASIC ELECTRIC ELEMENTS

January Kister

Person

Patents Grantslast 30 patents

Probe on carrier architecture for vertical probe arrays

Electrical test probes having decoupled electrical and mechanical d...

MEMS probe card assembly having decoupled electrical and mechanical...

Probe tip with embedded skate

Probe skates for electrical testing of convex pad topologies

Probes with high current carrying capability and laser machining me...

Multiple contact probes

Probe retention arrangement

Vertical probe array arranged to provide space transformation

Probe bonding method having improved control of bonding material

Probes with offset arm and suspension structure

Layered probes with core

Multiple contact probes

Probe retention arrangement

Fine pitch guided vertical probe array having enclosed probe flexures

Vertical guided layered probe

Low profile probe having improved mechanical scrub and reduced cont...

Vertical probe array arranged to provide space transformation

Probe bonding method having improved control of bonding material

Probe skates for electrical testing of convex pad topologies

Probes with offset arm and suspension structure

Knee probe having reduced thickness section for control of scrub mo...

Vertical probe array arranged to provide space transformation

Low profile probe having improved mechanical scrub and reduced cont...

Probe cards employing probes having retaining portions for potting...

Probes with self-cleaning blunt skates for contacting conductive pads

Knee probe having increased scrub motion

Vertical guided probe array providing sideways scrub motion

Knee probe having reduced thickness section for control of scrub mo...

Low profile probe having improved mechanical scrub and reduced cont...

Patents Applicationslast 30 patents

Probe on carrier architecture for vertical probe arrays

Electrical test probes having decoupled electrical and mechanical d...

Probe tip with embedded skate

MEMS Probe Card Assembly having Decoupled Electrical and Mechanical...

PROBE RETENTION ARRANGEMENT

VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY

PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNO...

VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION

PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL

PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

PROBES WITH HIGH CURRENT CARRYING CAPABILITY AND LASER MACHINING ME...

LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONT...

VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION

MULTIPLE CONTACT PROBES

PROBE RETENTION ARRANGEMENT

PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

Knee Probe Having Reduced Thickness Section for Control of Scrub Mo...

Layered Probes With Core

Vertical Guided Layered Probe

Low Profile Probe Having Improved Mechanical Scrub and Reduced Cont...

Probe bonding method having improved control of bonding material

Vertical Probe Array Arranged to Provide Space Transformation

Vertical probe array arranged to provide space transformation

Probe cards employing probes having retaining portions for potting...

Knee probe having reduced thickness section for control of scrub mo...

Space transformers employing wire bonds for interconnections with f...

Probe cards employing probes having retaining portions for potting...

Multipath interconnect with meandering contact cantilevers

Sheet metal coil spring testing connector

Multipath interconnect with meandering contact cantilevers