Membership
Tour
Register
Log in
Jason Mroczkowski
Follow
Person
Hudson, WI, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Dielectric resonating test contactor and method
Patent number
12,123,897
Issue date
Oct 22, 2024
Xcerra Corporation
James Hattis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Coaxial probe
Patent number
12,111,343
Issue date
Oct 8, 2024
Xcerra Corporation
Yukang Feng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test socket assembly with antenna and related methods
Patent number
11,662,363
Issue date
May 30, 2023
Xcerra Corporation
Jason Mroczkowski
G01 - MEASURING TESTING
Information
Patent Grant
System and method for attenuating and/or terminating RF circuit
Patent number
11,650,227
Issue date
May 16, 2023
Xcerra Corporation
Yukang Feng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test socket assembly and related methods
Patent number
11,088,051
Issue date
Aug 10, 2021
Xcerra Corporation
Valts Treibergs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test socket assembly and related methods
Patent number
10,037,933
Issue date
Jul 31, 2018
Xcerra Corporation
Valts Treibergs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test socket assembly and related methods
Patent number
9,875,954
Issue date
Jan 23, 2018
Xcerra Corporation
Valts Treibergs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated printed circuit board and test contactor for high speed...
Patent number
7,173,442
Issue date
Feb 6, 2007
Delaware Capital Formation, Inc.
Valts Treibergs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
Publication number
20230243869
Publication date
Aug 3, 2023
XCERRA CORPORATION
Yukang Feng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REFLECTIVE AND INTERFERENCE CONTROLLED ABSORPTIVE CONTACTOR
Publication number
20230024755
Publication date
Jan 26, 2023
XCERRA CORPORATION
Yukang Feng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COAXIAL PROBE
Publication number
20220043029
Publication date
Feb 10, 2022
XCERRA CORPORATION
Yukang Feng
G01 - MEASURING TESTING
Information
Patent Application
TEST SOCKET ASSEMBLY WITH ANTENNA AND RELATED METHODS
Publication number
20210364547
Publication date
Nov 25, 2021
XCERRA CORPORATION
Jason Mroczkowski
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
Publication number
20210223285
Publication date
Jul 22, 2021
XCERRA CORPORATION
Yukang Feng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIELECTRIC RESONATING TEST CONTACTOR AND METHOD
Publication number
20210190821
Publication date
Jun 24, 2021
XCERRA CORPORATION
James Hattis
G01 - MEASURING TESTING
Information
Patent Application
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
Publication number
20200116759
Publication date
Apr 16, 2020
XCERRA CORPORATION
Jason Mroczkowski
G01 - MEASURING TESTING
Information
Patent Application
HIGH FREQUENCY CIRCUIT WITH RADAR ABSORBING MATERIAL TERMINATION CO...
Publication number
20200083582
Publication date
Mar 12, 2020
XCERRA CORPORATION
Jason Mroczkowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
Publication number
20180096917
Publication date
Apr 5, 2018
XCERRA CORPORATION
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
Publication number
20150369840
Publication date
Dec 24, 2015
XCERRA CORPORATION
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Application
Integrated printed circuit board and test contactor for high speed...
Publication number
20050046433
Publication date
Mar 3, 2005
Valts Treibergs
G01 - MEASURING TESTING