Jay C. Nelson

Person

Grapevine, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,675,300
- Issue date Mar 9, 2010
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,319,336
- Issue date Jan 15, 2008
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for automatically positioning electronic dice within comp...
- Patent number 6,900,459
- Issue date May 31, 2005
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically positioning electronic die within componen...
- Patent number 6,492,187
- Issue date Dec 10, 2002
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for positioning a semiconductor die within a temporary package
- Patent number 6,353,312
- Issue date Mar 5, 2002
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,210,984
- Issue date Apr 3, 2001
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,150,828
- Issue date Nov 21, 2000
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 6,064,194
- Issue date May 16, 2000
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 5,955,877
- Issue date Sep 21, 1999
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automatically positioning electronic dice...
- Patent number 5,894,218
- Issue date Apr 13, 1999
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
- Publication number 20080150557
- Publication date Jun 26, 2008
- ZYVEX INSTRUMENTS, LLC
- Christof BAUR
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam device probe operation
- Publication number 20060192116
- Publication date Aug 31, 2006
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for automatically positioning electronic dice...
- Publication number 20030088973
- Publication date May 15, 2003
- Warren M. Farnworth
- G01 - MEASURING TESTING

Jay C. Nelson

Person

Patents Grantslast 30 patents

Charged particle beam device probe operation

Charged particle beam device probe operation

Apparatus for automatically positioning electronic dice within comp...

Method for automatically positioning electronic die within componen...

Method for positioning a semiconductor die within a temporary package

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Method and apparatus for automatically positioning electronic dice...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE PROBE OPERATION

Charged particle beam device probe operation

Method and apparatus for automatically positioning electronic dice...