Jay M. Wardle

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Seattle, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Message filters, automatic binding, and encoding for distributed sy...
- Patent number 6,167,457
- Issue date Dec 26, 2000
- Agilent Technologies
- John C Eidson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Group delay estimate system using least square fit to phase respons...
- Patent number 6,046,595
- Issue date Apr 4, 2000
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,420,514
- Issue date May 30, 1995
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Group delay estimate system using least square fit to phase respons...
- Patent number 5,399,976
- Issue date Mar 21, 1995
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,300,878
- Issue date Apr 5, 1994
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,168,213
- Issue date Dec 1, 1992
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING
Information Patent Grant
Swept signal analysis instrument and method
- Patent number 5,117,179
- Issue date May 26, 1992
- Hewlett-Packard Company
- Jay M. Wardle
- G01 - MEASURING TESTING