Jean Canteloup

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Montlhery, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for semiconductor wafer fabrication process real-...
- Patent number 6,363,294
- Issue date Mar 26, 2002
- International Business Machines Corporation
- Philippe Coronel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for real-time in-situ monitoring of a trench formation process
- Patent number 5,807,761
- Issue date Sep 15, 1998
- International Business Machines Corporation
- Philippe Coronel
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus for monitoring the dry etching of a dielectric film to a...
- Patent number 5,658,418
- Issue date Aug 19, 1997
- International Business Machines Corporation
- Philippe Coronel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for monitoring the thickness of thin layers
- Patent number 4,676,644
- Issue date Jun 30, 1987
- Compagnie Industrielle des Telecommunications
- Jean Canteloup
- G01 - MEASURING TESTING
Information Patent Grant
Process and devices for the elaboration of preforms for optical fibers
- Patent number 4,207,834
- Issue date Jun 17, 1980
- A.R.M.I.N.E.S.
- Jean Canteloup
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...