Jean-Luc Everaert

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Gooik, BE

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Patents Grantslast 30 patents

Information Patent Grant
Methods of forming a semiconductor device by thermally treating a c...
- Patent number 9,799,523
- Issue date Oct 24, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hui OuYang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for characterizing shallow semiconductor junctions
- Patent number 9,472,474
- Issue date Oct 18, 2016
- Imec VZW
- Jean-Luc Everaert
- G01 - MEASURING TESTING
Information Patent Grant
Methods of forming a semiconductor device
- Patent number 9,159,582
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hui OuYang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mobility measurements of inversion charge carriers
- Patent number 7,663,393
- Issue date Feb 16, 2010
- IMEC
- Jean-Luc Everaert
- G01 - MEASURING TESTING
Information Patent Grant
Simplified bottom electrode-barrier structure for making a ferroele...
- Patent number 7,186,572
- Issue date Mar 6, 2007
- Interuniversitair Microelektronica Centrum (IMEC)
- Dirk Wouters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simplified bottom electrode-barrier structure for making a ferroele...
- Patent number 6,885,570
- Issue date Apr 26, 2005
- Interuniversitair Microelektronica Centrum vzw (IMEC vzw)
- Dirk Wouters
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods of Forming A Semiconductor Device
- Publication number 20160035575
- Publication date Feb 4, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hui OuYang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CHARACTERIZING SHALLOW SEMICONDUCTOR JUNCTIONS
- Publication number 20140197862
- Publication date Jul 17, 2014
- IMEC vzw
- Jean-Luc Everaert
- G01 - MEASURING TESTING
Information Patent Application
Methods of Forming a Semiconductor Device
- Publication number 20090117750
- Publication date May 7, 2009
- Interuniversitair Microelektronica Centrum (IMEC)
- Hui OuYang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOBILITY MEASUREMENTS OF INVERSION CHARGE CARRIERS
- Publication number 20080297189
- Publication date Dec 4, 2008
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Jean-Luc Everaert
- G01 - MEASURING TESTING
Information Patent Application
Simplified bottom electrode-barrier structure for making a ferroele...
- Publication number 20050186727
- Publication date Aug 25, 2005
- Dirk Wouters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simplified bottom electrode-barrier structure for making a ferroele...
- Publication number 20030112649
- Publication date Jun 19, 2003
- Dirk Wouters
- H01 - BASIC ELECTRIC ELEMENTS