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Jean-Luc Everaert
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Gooik, BE
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Patents Grants
last 30 patents
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Patent Grant
Methods of forming a semiconductor device by thermally treating a c...
Patent number
9,799,523
Issue date
Oct 24, 2017
Taiwan Semiconductor Manufacturing Company, Ltd.
Hui OuYang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for characterizing shallow semiconductor junctions
Patent number
9,472,474
Issue date
Oct 18, 2016
Imec VZW
Jean-Luc Everaert
G01 - MEASURING TESTING
Information
Patent Grant
Methods of forming a semiconductor device
Patent number
9,159,582
Issue date
Oct 13, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Hui OuYang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mobility measurements of inversion charge carriers
Patent number
7,663,393
Issue date
Feb 16, 2010
IMEC
Jean-Luc Everaert
G01 - MEASURING TESTING
Information
Patent Grant
Simplified bottom electrode-barrier structure for making a ferroele...
Patent number
7,186,572
Issue date
Mar 6, 2007
Interuniversitair Microelektronica Centrum (IMEC)
Dirk Wouters
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Simplified bottom electrode-barrier structure for making a ferroele...
Patent number
6,885,570
Issue date
Apr 26, 2005
Interuniversitair Microelektronica Centrum vzw (IMEC vzw)
Dirk Wouters
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Methods of Forming A Semiconductor Device
Publication number
20160035575
Publication date
Feb 4, 2016
Taiwan Semiconductor Manufacturing Company, Ltd.
Hui OuYang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR CHARACTERIZING SHALLOW SEMICONDUCTOR JUNCTIONS
Publication number
20140197862
Publication date
Jul 17, 2014
IMEC vzw
Jean-Luc Everaert
G01 - MEASURING TESTING
Information
Patent Application
Methods of Forming a Semiconductor Device
Publication number
20090117750
Publication date
May 7, 2009
Interuniversitair Microelektronica Centrum (IMEC)
Hui OuYang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MOBILITY MEASUREMENTS OF INVERSION CHARGE CARRIERS
Publication number
20080297189
Publication date
Dec 4, 2008
Interuniversitair Microelektronica Centrum vzw (IMEC)
Jean-Luc Everaert
G01 - MEASURING TESTING
Information
Patent Application
Simplified bottom electrode-barrier structure for making a ferroele...
Publication number
20050186727
Publication date
Aug 25, 2005
Dirk Wouters
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Simplified bottom electrode-barrier structure for making a ferroele...
Publication number
20030112649
Publication date
Jun 19, 2003
Dirk Wouters
H01 - BASIC ELECTRIC ELEMENTS