Jean Y. Yang

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dielectric extension to mitigate short channel effects
- Patent number 9,318,333
- Issue date Apr 19, 2016
- Cypress Semiconductor Corporation
- Vidyut Gopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory manufacturing process with bitline isolation
- Patent number 8,673,716
- Issue date Mar 18, 2014
- Spansion LLC
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device protection layer
- Patent number 8,415,734
- Issue date Apr 9, 2013
- Spansion LLC
- Rinji Sugino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strapping contact for charge protection
- Patent number 8,404,541
- Issue date Mar 26, 2013
- Spansion LLC
- Wei Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3-D integrated circuit system and method
- Patent number 7,998,846
- Issue date Aug 16, 2011
- Spansion LLC
- Eunha Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strapping contact for charge protection
- Patent number 7,750,407
- Issue date Jul 6, 2010
- Spansion LLC
- Wei Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improved planarization in semiconductor devices
- Patent number 7,696,094
- Issue date Apr 13, 2010
- Spansion LLC
- David Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bit line implant
- Patent number 7,432,178
- Issue date Oct 7, 2008
- Advanced Micro Devices, Inc.
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Void free interlayer dielectric
- Patent number 7,307,027
- Issue date Dec 11, 2007
- Advanced Micro Devices, Inc.
- Minh Van Ngo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated ONO processing for semiconductor devices using in-situ s...
- Patent number 7,115,469
- Issue date Oct 3, 2006
- Spansion, LLC
- Arvind Halliyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
UV-blocking etch stop layer for reducing UV-induced charging of cha...
- Patent number 7,091,088
- Issue date Aug 15, 2006
- Spansion LLC
- Ning Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ONO fabrication process for increasing oxygen content at bottom oxi...
- Patent number 7,033,957
- Issue date Apr 25, 2006
- FASL, LLC
- Hidehiko Shiraiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Disposable hard mask for memory bitline scaling
- Patent number 7,018,868
- Issue date Mar 28, 2006
- Advanced Micro Devices, Inc.
- Jean Y. Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing resolution enhancement system and metho...
- Patent number 6,994,939
- Issue date Feb 7, 2006
- Advanced Micro Devices, Inc.
- Kouros Ghandehari
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Flash memory cell with UV protective layer
- Patent number 6,989,563
- Issue date Jan 24, 2006
- Advanced Micro Devices, Inc.
- Krishnashree Achuthan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ONO fabrication process for reducing oxygen vacancy content in bott...
- Patent number 6,969,886
- Issue date Nov 29, 2005
- Fasl, LLC
- Jaeyong Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabrication of nitride layer with reduced hydrogen cont...
- Patent number 6,955,965
- Issue date Oct 18, 2005
- Fasl, LLC
- Arvind Halliyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabrication of spacer layer with reduced hydrogen conte...
- Patent number 6,949,481
- Issue date Sep 27, 2005
- Fasl, LLC
- Arvind Halliyal
- G11 - INFORMATION STORAGE
Information Patent Grant
Tightly spaced gate formation through damascene process
- Patent number 6,933,219
- Issue date Aug 23, 2005
- Advanced Micro Devices, Inc.
- Emmanuil H. Lingunis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bitline hard mask spacer flow for memory cell scaling
- Patent number 6,927,145
- Issue date Aug 9, 2005
- Advanced Micro Devices, Inc.
- Jean Y. Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for preventing UV radiation damage in a memory...
- Patent number 6,894,342
- Issue date May 17, 2005
- Spansion LLC
- Angela Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor memory with deuterated mate...
- Patent number 6,884,681
- Issue date Apr 26, 2005
- FASL LLC
- Tazrien Kamal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for preventing process-induced UV radiation da...
- Patent number 6,833,581
- Issue date Dec 21, 2004
- Spansion LLC
- Angela Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ONO fabrication process for reducing oxygen vacancy content in bott...
- Patent number 6,803,275
- Issue date Oct 12, 2004
- Fasl, LLC
- Jaeyong Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating and planarizing dual poly scalable SONOS fl...
- Patent number 6,797,565
- Issue date Sep 28, 2004
- Advanced Micro Devices, Inc.
- Jean Yee-Mei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for suppressing oxide encroachment in a floati...
- Patent number 6,767,791
- Issue date Jul 27, 2004
- Advanced Micro Devices, Inc.
- Yider Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for preventing UV radiation damage and increas...
- Patent number 6,765,254
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Angela Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference cell with various load circuits compensating for source s...
- Patent number 6,754,106
- Issue date Jun 22, 2004
- Advanced Micro Devices, Inc.
- Yider Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array having shallow bit line with silicide contact portion...
- Patent number 6,744,105
- Issue date Jun 1, 2004
- Advanced Micro Devices, Inc.
- Cinti Xiaohua Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for reducing charge loss in a memory cell
- Patent number 6,737,701
- Issue date May 18, 2004
- Advanced Micro Devices, Inc.
- Amy C. Tu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE PROTECTION LAYER
- Publication number 20130228851
- Publication date Sep 5, 2013
- SPANSION LLC
- Rinji Sugino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D INTEGRATED CIRCUIT SYSTEM AND METHOD
- Publication number 20110272775
- Publication date Nov 10, 2011
- Eunha KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAPPING CONTACT FOR CHARGE PROTECTION
- Publication number 20100240210
- Publication date Sep 23, 2010
- SPANSION LLC
- Wei ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3-D INTEGRATED CIRCUIT SYSTEM AND METHOD
- Publication number 20100065940
- Publication date Mar 18, 2010
- Eunha KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVED PLANARIZATION IN SEMICONDUCTOR DEVICES
- Publication number 20080160764
- Publication date Jul 3, 2008
- David MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAPPING CONTACT FOR CHARGE PROTECTION
- Publication number 20080142889
- Publication date Jun 19, 2008
- SPANSION LLC
- Wei ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bit line implant
- Publication number 20070093042
- Publication date Apr 26, 2007
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Undoped oxide liner/BPSG for improved data retention
- Publication number 20050006693
- Publication date Jan 13, 2005
- Advanced Micro Devices, Inc.
- Minh Van Ngo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARD MASK PROCESS FOR MEMORY DEVICE WITHOUT BITLINE SHORTS
- Publication number 20040014290
- Publication date Jan 22, 2004
- Jean Y. Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory manufacturing process with bitline isolation
- Publication number 20030190786
- Publication date Oct 9, 2003
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacture of semiconductor device with spacing narrower than lith...
- Publication number 20030064585
- Publication date Apr 3, 2003
- Yider Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simultaneous formation of charge storage and bitline to wordline is...
- Publication number 20020192910
- Publication date Dec 19, 2002
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Planar structure for non-volatile memory devices
- Publication number 20020063277
- Publication date May 30, 2002
- Mark T. Ramsbey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Algorithm for detecting sloped contact holes using a critical-dimen...
- Publication number 20020000550
- Publication date Jan 3, 2002
- Jean Yang
- H01 - BASIC ELECTRIC ELEMENTS

Jean Y. Yang

Person

Patents Grantslast 30 patents

Dielectric extension to mitigate short channel effects

Memory manufacturing process with bitline isolation

Memory device protection layer

Strapping contact for charge protection

3-D integrated circuit system and method

Strapping contact for charge protection

Method for improved planarization in semiconductor devices

Bit line implant

Void free interlayer dielectric

Integrated ONO processing for semiconductor devices using in-situ s...

UV-blocking etch stop layer for reducing UV-induced charging of cha...

ONO fabrication process for increasing oxygen content at bottom oxi...

Disposable hard mask for memory bitline scaling

Semiconductor manufacturing resolution enhancement system and metho...

Flash memory cell with UV protective layer

ONO fabrication process for reducing oxygen vacancy content in bott...

Process for fabrication of nitride layer with reduced hydrogen cont...

Process for fabrication of spacer layer with reduced hydrogen conte...

Tightly spaced gate formation through damascene process

Bitline hard mask spacer flow for memory cell scaling

Structure and method for preventing UV radiation damage in a memory...

Method of manufacturing a semiconductor memory with deuterated mate...

Structure and method for preventing process-induced UV radiation da...

ONO fabrication process for reducing oxygen vacancy content in bott...

Methods for fabricating and planarizing dual poly scalable SONOS fl...

Structure and method for suppressing oxide encroachment in a floati...

Structure and method for preventing UV radiation damage and increas...

Reference cell with various load circuits compensating for source s...

Memory array having shallow bit line with silicide contact portion...

Structure and method for reducing charge loss in a memory cell

Patents Applicationslast 30 patents

MEMORY DEVICE PROTECTION LAYER

3D INTEGRATED CIRCUIT SYSTEM AND METHOD

STRAPPING CONTACT FOR CHARGE PROTECTION

3-D INTEGRATED CIRCUIT SYSTEM AND METHOD

METHOD FOR IMPROVED PLANARIZATION IN SEMICONDUCTOR DEVICES

STRAPPING CONTACT FOR CHARGE PROTECTION

Bit line implant

Undoped oxide liner/BPSG for improved data retention

HARD MASK PROCESS FOR MEMORY DEVICE WITHOUT BITLINE SHORTS

Memory manufacturing process with bitline isolation

Manufacture of semiconductor device with spacing narrower than lith...

Simultaneous formation of charge storage and bitline to wordline is...

Planar structure for non-volatile memory devices

Algorithm for detecting sloped contact holes using a critical-dimen...