Jeff A. Engel

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Chisago City, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Built-in-self-test scheme for testing multiple memory elements
- Patent number 5,475,815
- Issue date Dec 12, 1995
- Unisys Corporation
- Larry L. Byers
- G11 - INFORMATION STORAGE
Information Patent Grant
VLSI embedded RAM test
- Patent number 5,471,482
- Issue date Nov 28, 1995
- Unisys Corporation
- Larry L. Byers
- G11 - INFORMATION STORAGE