Number | Name | Date | Kind |
---|---|---|---|
3761695 | Eichelberger | Sep 1973 | |
4195770 | Benton et al. | Apr 1980 | |
4225958 | Funatsu | Sep 1980 | |
4298980 | Hajdu et al. | Nov 1981 | |
4308616 | Timoc | Dec 1981 | |
4369511 | Kimura et al. | Jan 1983 | |
4370746 | Jones et al. | Jan 1983 | |
4433413 | Fasang | Feb 1984 | |
4476431 | Blum | Oct 1984 | |
4493077 | Agrawal et al. | Jan 1985 | |
4513283 | Leininger | Apr 1985 | |
4534028 | Trischler | Aug 1985 | |
4535467 | Davis et al. | Aug 1985 | |
4546272 | Suzuki et al. | Oct 1985 | |
4566104 | Bradshaw et al. | Jan 1986 | |
4580066 | Berndt | Apr 1986 | |
4608683 | Shigaki | Aug 1986 | |
4628217 | Berndt | Dec 1986 | |
4701920 | Resnick et al. | Oct 1987 | |
4782487 | Smelser | Nov 1988 | |
4783785 | Hanta | Nov 1988 | |
4788684 | Kawaguchi et al. | Nov 1988 | |
4835774 | Ooshima et al. | May 1989 | |
4847519 | Wahl et al. | Jul 1989 | |
4876685 | Rich | Oct 1989 | |
4888772 | Tanigawa | Dec 1989 | |
4903266 | Hack | Feb 1990 | |
4969148 | Nadeau-Dostie et al. | Nov 1990 | |
5107501 | Zorian | Apr 1992 | |
5138619 | Fasang et al. | Aug 1992 | |
5173906 | Dreibelbis et al. | Dec 1992 | |
5222066 | Grula et al. | Jun 1993 | |
5224101 | Popyack, Jr. | Jun 1993 |
Entry |
---|
IBM Technical Disclosure Bulletin, vol. 18, No. 5, Oct. 1975, pp. 1415-1416. |
IBM Technical Disclosure Bulletin, vol. 25, No. 10, Mar. 1983, pp. 5196-5198. |
Electronics, "Level-Sensitive Scan Design Test Chips, Boards, System", Neil C. Berglund, vol. 52, No. 6, Mar. 15, 1979, pp. 108-110. |