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Jeff Spencer

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  • Vernonia, OR, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Chuck for holding a device under test
    • Patent number 7,876,115
    • Issue date Jan 25, 2011
    • Cascade Microtech, Inc.
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chuck for holding a device under test
    • Patent number 7,492,172
    • Issue date Feb 17, 2009
    • Cascade Microtech, Inc.
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe station with two platens
    • Patent number 7,368,925
    • Issue date May 6, 2008
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe station
    • Patent number 6,777,964
    • Issue date Aug 17, 2004
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Chuck for holding a device under test
    • Publication number 20090153167
    • Publication date Jun 18, 2009
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe station
    • Publication number 20080042675
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe station
    • Publication number 20050156610
    • Publication date Jul 21, 2005
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Application

    Chuck for holding a device under test
    • Publication number 20040232935
    • Publication date Nov 25, 2004
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe station
    • Publication number 20030141861
    • Publication date Jul 31, 2003
    • Peter Navratil
    • G01 - MEASURING TESTING