Jeff WORONES

Person

Seattle, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Clamp meter
- Patent number D993054
- Issue date Jul 25, 2023
- Fluke Corporation
- Ginger M. Woo
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Non-contact current measurement system
- Patent number 11,237,192
- Issue date Feb 1, 2022
- Fluke Corporation
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Grant
Clamp meter
- Patent number D938843
- Issue date Dec 21, 2021
- Fluke Corporation
- Ginger M. Woo
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Non-contact electrical parameter measurement device with clamp jaw...
- Patent number 11,112,433
- Issue date Sep 7, 2021
- Fluke Corporation
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Grant
Flexible jaw probe for non-contact electrical parameter measurement
- Patent number 10,908,188
- Issue date Feb 2, 2021
- Fluke Corporation
- Ferdinand Y. Laurino
- G01 - MEASURING TESTING
Information Patent Grant
Clamp probe for non-contact electrical parameter measurement
- Patent number 10,775,409
- Issue date Sep 15, 2020
- Fluke Corporation
- Jeffrey Worones
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable length Rogowski coil measurement device with non-contact...
- Patent number 10,746,767
- Issue date Aug 18, 2020
- Fluke Corporation
- Jeffrey Worones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor subsystems for non-contact voltage measurement devices
- Patent number 10,605,832
- Issue date Mar 31, 2020
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact current measurement system
- Patent number 10,591,515
- Issue date Mar 17, 2020
- Fluke Corporation
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact electrical parameter measurement systems
- Patent number 10,352,967
- Issue date Jul 16, 2019
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage measurement system using reference signal
- Patent number 10,139,435
- Issue date Nov 27, 2018
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Magnetically coupled ground reference probe
- Patent number 9,933,459
- Issue date Apr 3, 2018
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Voltage tester having alternatively attachable or separable probes
- Patent number 9,423,417
- Issue date Aug 23, 2016
- Fluke Corporation
- Ferdinand Laurino
- G01 - MEASURING TESTING
Information Patent Grant
Digital multimeter having improved rotary switch assembly
- Patent number 8,946,571
- Issue date Feb 3, 2015
- Fluke Corporation
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Grant
Simplified jaw assembly for a clamp meter
- Patent number 8,922,195
- Issue date Dec 30, 2014
- Fluke Corporation
- Jeff Worones
- G01 - MEASURING TESTING
Information Patent Grant
Digital multimeter having a case and a separate panel structure
- Patent number 8,466,671
- Issue date Jun 18, 2013
- Fluke Corporation
- Jeffrey E. Worones
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Voltage detector
- Patent number D661605
- Issue date Jun 12, 2012
- Fluke Corporation
- Ferdinand Laurino
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Digital multimeter having improved rotary switch assembly
- Patent number 8,093,516
- Issue date Jan 10, 2012
- Fluke Corporation
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Grant
Digital multimeter having hinged shield arrangement
- Patent number 8,013,594
- Issue date Sep 6, 2011
- Fluke Corporation
- Jeffrey E. Worones
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Voltage detector
- Patent number D642943
- Issue date Aug 9, 2011
- Fluke Corporation
- Ferdinand Laurino
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Digital multimeter having case panel structure
- Patent number 7,911,200
- Issue date Mar 22, 2011
- Fluke Corporation
- Jeffrey E. Worones
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Digital multimeter having housing sealing arrangement
- Patent number 7,830,135
- Issue date Nov 9, 2010
- Fluke Corporation
- Jeffrey E. Worones
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT DEVICE WITH CLAMP JAW...
- Publication number 20210041483
- Publication date Feb 11, 2021
- FLUKE CORPORATION
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT CURRENT MEASUREMENT SYSTEM
- Publication number 20200191836
- Publication date Jun 18, 2020
- FLUKE CORPORATION
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE JAW PROBE FOR NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT
- Publication number 20190346487
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Ferdinand Y. Laurino
- G01 - MEASURING TESTING
Information Patent Application
CLAMP PROBE FOR NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT
- Publication number 20190346484
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Jeffrey Worones
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE LENGTH ROGOWSKI COIL MEASUREMENT DEVICE WITH NON-CONTACT...
- Publication number 20190346492
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Jeffrey Worones
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT CURRENT MEASUREMENT SYSTEM
- Publication number 20180136260
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS
- Publication number 20180136257
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT SYSTEM USING REFERENCE SIGNAL
- Publication number 20180136264
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES
- Publication number 20180136259
- Publication date May 17, 2018
- FLUKE CORPORATION
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ATTACHING CAMERA OR IMAGING SENSOR TO TEST AND MEASUREMEN...
- Publication number 20160076936
- Publication date Mar 17, 2016
- FLUKE CORPORATION
- Michael A. Schoch
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM WITH REMOVABLE IMAGING TOOL
- Publication number 20160080666
- Publication date Mar 17, 2016
- FLUKE CORPORATION
- Michael D. Stuart
- G01 - MEASURING TESTING
Information Patent Application
ACCESSORY MOUNT ASSEMBLY AND METHODS OF USING SAME
- Publication number 20140042294
- Publication date Feb 13, 2014
- FLUKE CORPORATION
- Matthew Marzynski
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE TESTER HAVING ALTERNATIVELY ATTACHABLE OR SEPARABLE PROBES
- Publication number 20130093449
- Publication date Apr 18, 2013
- FLUKE CORPORATION
- Ferdinand LAURINO
- G01 - MEASURING TESTING
Information Patent Application
SIMPLIFIED JAW ASSEMBLY FOR A CLAMP METER
- Publication number 20120169324
- Publication date Jul 5, 2012
- FLUKE CORPORATION
- Jeff Worones
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL MULTIMETER HAVING IMPROVED ROTARY SWITCH ASSEMBLY
- Publication number 20120103765
- Publication date May 3, 2012
- FLUKE CORPORATION
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL MULTIMETER HAVING CASE PANEL STRUCTURE
- Publication number 20110140687
- Publication date Jun 16, 2011
- FLUKE CORPORATION
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
Digital multimeter having hinged shield arrangement
- Publication number 20090102455
- Publication date Apr 23, 2009
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
Digital multimeter having case panel structure
- Publication number 20090045806
- Publication date Feb 19, 2009
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
Digital multimeter having improved rotary switch assembly
- Publication number 20090045038
- Publication date Feb 19, 2009
- Jeffrey E. Worones
- G01 - MEASURING TESTING
Information Patent Application
Digital multimeter having housing sealing arrangement
- Publication number 20090045805
- Publication date Feb 19, 2009
- Jeffrey E. Worones
- G01 - MEASURING TESTING

Jeff WORONES

Person

Patents Grantslast 30 patents

Clamp meter

Non-contact current measurement system

Clamp meter

Non-contact electrical parameter measurement device with clamp jaw...

Flexible jaw probe for non-contact electrical parameter measurement

Clamp probe for non-contact electrical parameter measurement

Adjustable length Rogowski coil measurement device with non-contact...

Sensor subsystems for non-contact voltage measurement devices

Non-contact current measurement system

Non-contact electrical parameter measurement systems

Non-contact voltage measurement system using reference signal

Magnetically coupled ground reference probe

Voltage tester having alternatively attachable or separable probes

Digital multimeter having improved rotary switch assembly

Simplified jaw assembly for a clamp meter

Digital multimeter having a case and a separate panel structure

Voltage detector

Digital multimeter having improved rotary switch assembly

Digital multimeter having hinged shield arrangement

Voltage detector

Digital multimeter having case panel structure

Digital multimeter having housing sealing arrangement

Patents Applicationslast 30 patents

NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT DEVICE WITH CLAMP JAW...

NON-CONTACT CURRENT MEASUREMENT SYSTEM

FLEXIBLE JAW PROBE FOR NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT

CLAMP PROBE FOR NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT

ADJUSTABLE LENGTH ROGOWSKI COIL MEASUREMENT DEVICE WITH NON-CONTACT...

NON-CONTACT CURRENT MEASUREMENT SYSTEM

NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS

NON-CONTACT VOLTAGE MEASUREMENT SYSTEM USING REFERENCE SIGNAL

SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES

METHOD OF ATTACHING CAMERA OR IMAGING SENSOR TO TEST AND MEASUREMEN...

TEST AND MEASUREMENT SYSTEM WITH REMOVABLE IMAGING TOOL

ACCESSORY MOUNT ASSEMBLY AND METHODS OF USING SAME

VOLTAGE TESTER HAVING ALTERNATIVELY ATTACHABLE OR SEPARABLE PROBES

SIMPLIFIED JAW ASSEMBLY FOR A CLAMP METER

DIGITAL MULTIMETER HAVING IMPROVED ROTARY SWITCH ASSEMBLY

DIGITAL MULTIMETER HAVING CASE PANEL STRUCTURE

Digital multimeter having hinged shield arrangement

Digital multimeter having case panel structure

Digital multimeter having improved rotary switch assembly

Digital multimeter having housing sealing arrangement