Jeffrey H. Oppold

Person

Richmond, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and structure for screening NFET-to-PFET device performance...
- Patent number 8,196,088
- Issue date Jun 5, 2012
- International Business Machines Corporation
- Jeffrey H. Oppold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,870,525
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,716,616
- Issue date May 11, 2010
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,401,307
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Redundancy register architecture for soft-error tolerance and metho...
- Patent number 7,117,428
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Jeffrey H Oppold
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for enhancing the soft error rate immunity of...
- Patent number 6,917,221
- Issue date Jul 12, 2005
- International Business Machines Corporation
- Kerry Bernstein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and design for measuring SRAM array leakage macro (ALM)
- Patent number 6,778,449
- Issue date Aug 17, 2004
- International Business Machines Corporation
- Matthew J. Breitwisch
- G11 - INFORMATION STORAGE
Information Patent Grant
Three device DRAM cell with integrated capacitor and local intercon...
- Patent number 6,420,746
- Issue date Jul 16, 2002
- International Business Machines Corporation
- John A. Bracchitta
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconducto...
- Publication number 20100174503
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Bruce Balch
- G01 - MEASURING TESTING
Information Patent Application
Structure for a Method and Structure for Screening NFET-to-PFET Dev...
- Publication number 20090140245
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Jeffrey H. Oppold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Structure for Screening NFET-to-PFET Device Performance...
- Publication number 20090144024
- Publication date Jun 4, 2009
- Jeffrey H. Oppold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20080216036
- Publication date Sep 4, 2008
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20080052656
- Publication date Feb 28, 2008
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20060101361
- Publication date May 11, 2006
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Redundancy register architecture for soft-error tolerance and metho...
- Publication number 20060059393
- Publication date Mar 16, 2006
- International Business Machines Corporation
- Jeffrey H. Oppold
- G11 - INFORMATION STORAGE
Information Patent Application
ZERO THRESHOLD VOLTAGE PFET AND METHOD OF MAKING SAME
- Publication number 20040251496
- Publication date Dec 16, 2004
- International Business Machines Corporation
- Jeffrey S. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ENHANCING THE SOFT ERROR RATE IMMUNITY OF...
- Publication number 20040216015
- Publication date Oct 28, 2004
- International Business Machines Corporation
- Kerry Bernstein
- H03 - BASIC ELECTRONIC CIRCUITRY

Jeffrey H. Oppold

Person

Patents Grantslast 30 patents

Method and structure for screening NFET-to-PFET device performance...

Slack sensitivity to parameter variation based timing analysis

Slack sensitivity to parameter variation based timing analysis

Slack sensitivity to parameter variation based timing analysis

Redundancy register architecture for soft-error tolerance and metho...

Method and apparatus for enhancing the soft error rate immunity of...

Method and design for measuring SRAM array leakage macro (ALM)

Three device DRAM cell with integrated capacitor and local intercon...

Patents Applicationslast 30 patents

Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconducto...

Structure for a Method and Structure for Screening NFET-to-PFET Dev...

Method and Structure for Screening NFET-to-PFET Device Performance...

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

Redundancy register architecture for soft-error tolerance and metho...

ZERO THRESHOLD VOLTAGE PFET AND METHOD OF MAKING SAME

METHOD AND APPARATUS FOR ENHANCING THE SOFT ERROR RATE IMMUNITY OF...