Jeffrey Hicks

Person

Manning, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
FinFET transistors as antifuse elements
- Patent number 11,515,251
- Issue date Nov 29, 2022
- Intel Corporation
- Vincent Dorgan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot carrier injection fuse memory
- Patent number 11,348,651
- Issue date May 31, 2022
- Intel Corporation
- Sarvesh Kulkarni
- G11 - INFORMATION STORAGE
Information Patent Grant
Antifuse memory arrays with antifuse elements at the back-end-of-li...
- Patent number 11,264,317
- Issue date Mar 1, 2022
- Intel Corporation
- Vincent Dorgan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal interconnect fuse memory arrays
- Patent number 11,239,149
- Issue date Feb 1, 2022
- Intel Corporation
- Vincent Dorgan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse programming schemes for robust yield
- Patent number 8,331,186
- Issue date Dec 11, 2012
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse programming schemes for robust yield
- Patent number 7,889,587
- Issue date Feb 15, 2011
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Grant
Energy absorbing structures to prevent damage to an integrated circuit
- Patent number 5,880,528
- Issue date Mar 9, 1999
- Intel Corporation
- Krishna Seshan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HOT CARRIER INJECTION FUSE MEMORY
- Publication number 20200105356
- Publication date Apr 2, 2020
- Intel Corporation
- Sarvesh KULKARNI
- G11 - INFORMATION STORAGE
Information Patent Application
ANTIFUSE MEMORY ARRAYS WITH ANTIFUSE ELEMENTS AT THE BACK-END-OF-LI...
- Publication number 20190304894
- Publication date Oct 3, 2019
- Intel Corporation
- Vincent DORGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL INTERCONNECT FUSE MEMORY ARRAYS
- Publication number 20190304893
- Publication date Oct 3, 2019
- Intel Corporation
- Vincent DORGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET TRANSISTORS AS ANTIFUSE ELEMENTS
- Publication number 20190304906
- Publication date Oct 3, 2019
- Intel Corporation
- Vincent DORGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL FUSE PROGRAMMING SCHEMES FOR ROBUST YIELD
- Publication number 20110103170
- Publication date May 5, 2011
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Application
High voltage compliant apparatus for semiconductor fabrication proc...
- Publication number 20090323235
- Publication date Dec 31, 2009
- Sangwoo Pae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for detection of edge damages
- Publication number 20080203388
- Publication date Aug 28, 2008
- Jun He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel fuse programming schemes for robust yield
- Publication number 20080136496
- Publication date Jun 12, 2008
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Application
Standby circuitry for fuse cell
- Publication number 20070217248
- Publication date Sep 20, 2007
- Zhanping Chen
- G11 - INFORMATION STORAGE

Jeffrey Hicks

Person

Patents Grantslast 30 patents

FinFET transistors as antifuse elements

Hot carrier injection fuse memory

Antifuse memory arrays with antifuse elements at the back-end-of-li...

Metal interconnect fuse memory arrays

Fuse programming schemes for robust yield

Fuse programming schemes for robust yield

Energy absorbing structures to prevent damage to an integrated circuit

Patents Applicationslast 30 patents

HOT CARRIER INJECTION FUSE MEMORY

ANTIFUSE MEMORY ARRAYS WITH ANTIFUSE ELEMENTS AT THE BACK-END-OF-LI...

METAL INTERCONNECT FUSE MEMORY ARRAYS

FinFET TRANSISTORS AS ANTIFUSE ELEMENTS

NOVEL FUSE PROGRAMMING SCHEMES FOR ROBUST YIELD

High voltage compliant apparatus for semiconductor fabrication proc...

Apparatus and method for detection of edge damages

Novel fuse programming schemes for robust yield

Standby circuitry for fuse cell