Jeffrey S. Hale

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,675,208
- Issue date Jun 13, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,989,601
- Issue date Apr 27, 2021
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer or polarimeter system having at least one rotating ele...
- Patent number 10,775,298
- Issue date Sep 15, 2020
- J.A. WOOLLAM CO., INC.
- Christopher D. Hassler
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Beam focusing and reflecting optics with enhanced detector system
- Patent number 10,338,362
- Issue date Jul 2, 2019
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Method to analyze spectroscopic ellipsometry or intensity data of p...
- Patent number 10,175,160
- Issue date Jan 8, 2019
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Deviation angle self-compensating substantially achromatic retarder
- Patent number 10,061,068
- Issue date Aug 28, 2018
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G02 - OPTICS
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,018,815
- Issue date Jul 10, 2018
- J.A. Woolam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Method to analyze spectroscopic ellipsometry data of porous samples...
- Patent number 9,976,902
- Issue date May 22, 2018
- J.A. Woolam Co., Inc.
- Stefan Schoeche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of characterizing a beam of electromagnetic radiation in ell...
- Patent number 9,952,141
- Issue date Apr 24, 2018
- J. A. Woollam Co., Inc.
- Jeffrey S. Hale
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and beam collecting optics with wavelength dependent...
- Patent number 9,921,395
- Issue date Mar 20, 2018
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Beam focusing and beam collecting optics
- Patent number 9,500,843
- Issue date Nov 22, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Reflective focusing optics
- Patent number 9,442,016
- Issue date Sep 13, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
In line ellipsometer system and method of use
- Patent number 9,347,768
- Issue date May 24, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 8,436,994
- Issue date May 7, 2013
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 7,872,751
- Issue date Jan 18, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining substrate etch depth
- Patent number 7,705,995
- Issue date Apr 27, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system
- Patent number 7,623,237
- Issue date Nov 24, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer meeting scheimpflug condition with provision of an ess...
- Patent number 7,567,345
- Issue date Jul 28, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam chromatic shifting and directing means
- Patent number 7,535,566
- Issue date May 19, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Discrete polarization state spectroscopic ellipsometer system and m...
- Patent number 7,492,455
- Issue date Feb 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining initial thickness value for sample surface la...
- Patent number 7,362,435
- Issue date Apr 22, 2008
- J.A. Wollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,336,361
- Issue date Feb 26, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Rotating or rotatable compensator system providing aberation correc...
- Patent number 7,304,737
- Issue date Dec 4, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Application of intermediate wavelength band spectroscopic ellipsome...
- Patent number 7,295,313
- Issue date Nov 13, 2007
- J.A. Wollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Combined spatial filter and relay systems in rotating compensator e...
- Patent number 7,245,376
- Issue date Jul 17, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Broadband ellipsometer or polarimeter system including at least one...
- Patent number 7,215,424
- Issue date May 8, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Rotating or rotatable compensator spectroscopic ellipsometer system...
- Patent number 7,193,710
- Issue date Mar 20, 2007
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer or polarimeter and the like system with beam chromatic...
- Patent number 7,099,006
- Issue date Aug 29, 2006
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Discrete polarization state rotatable compensator spectroscopic ell...
- Patent number 7,075,649
- Issue date Jul 11, 2006
- J. A. Woollam Co.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Publication number 20220244169
- Publication date Aug 4, 2022
- J. A. WOOLLAM CO., INC.
- Ping He
- G02 - OPTICS
Information Patent Application
BEAM FOCUSING AND BEAM COLLECTING OPTICS
- Publication number 20160356998
- Publication date Dec 8, 2016
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Reflective focusing optics
- Publication number 20150355029
- Publication date Dec 10, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20110109906
- Publication date May 12, 2011
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20090103093
- Publication date Apr 23, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS

Jeffrey S. Hale

Person

Patents Grantslast 30 patents

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Beam focusing and reflective optics

Ellipsometer or polarimeter system having at least one rotating ele...

Beam focusing and reflecting optics with enhanced detector system

Method to analyze spectroscopic ellipsometry or intensity data of p...

Deviation angle self-compensating substantially achromatic retarder

Beam focusing and reflective optics

Method to analyze spectroscopic ellipsometry data of porous samples...

Method of characterizing a beam of electromagnetic radiation in ell...

Beam focusing and beam collecting optics with wavelength dependent...

Beam focusing and beam collecting optics

Reflective focusing optics

In line ellipsometer system and method of use

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Sample investigating system and method of use

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Method of determining substrate etch depth

Sample investigating system

Ellipsometer meeting scheimpflug condition with provision of an ess...

Beam chromatic shifting and directing means

Discrete polarization state spectroscopic ellipsometer system and m...

Method of determining initial thickness value for sample surface la...

Spectroscopic ellipsometer and polarimeter systems

Rotating or rotatable compensator system providing aberation correc...

Application of intermediate wavelength band spectroscopic ellipsome...

Combined spatial filter and relay systems in rotating compensator e...

Broadband ellipsometer or polarimeter system including at least one...

Rotating or rotatable compensator spectroscopic ellipsometer system...

Ellipsometer or polarimeter and the like system with beam chromatic...

Discrete polarization state rotatable compensator spectroscopic ell...

Patents Applicationslast 30 patents

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

BEAM FOCUSING AND BEAM COLLECTING OPTICS

Reflective focusing optics

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Combined spatial filter and relay systems in rotating compensator e...