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Jeffrey Upton
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Acton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Calibration system and technique for a scalable, analog monopulse n...
Patent number
9,397,766
Issue date
Jul 19, 2016
Raytheon Company
Angelo M. Puzella
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for reducing sidelobes in large phased array r...
Patent number
9,373,888
Issue date
Jun 21, 2016
Raytheon Company
Jack J. Schuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for volumetric coverage with image beam super...
Patent number
9,070,964
Issue date
Jun 30, 2015
Raytheon Company
Jack J. Schuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration of large phased arrays using fourier gauge
Patent number
9,019,153
Issue date
Apr 28, 2015
Raytheon Company
Jack J. Schuss
G01 - MEASURING TESTING
Information
Patent Grant
Array antenna having multiple independently steered beams
Patent number
6,232,920
Issue date
May 15, 2001
Raytheon Company
Eli Brookner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Array antenna having multiple independently steered beams
Patent number
6,104,343
Issue date
Aug 15, 2000
Raytheon Company
Eli Brookner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scan compensation for array antenna on a curved surface
Patent number
5,276,452
Issue date
Jan 4, 1994
Raytheon Company
Jack J. Schuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low sidelobes antenna
Patent number
5,187,491
Issue date
Feb 16, 1993
Raytheon Company
Jack J. Schuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple frequency antenna feed
Patent number
5,041,840
Issue date
Aug 20, 1991
Frank Cipolla
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Calibration System and Technique For A Scalable, Analog Monopulse N...
Publication number
20140111373
Publication date
Apr 24, 2014
Raytheon Company
Angelo M. Puzella
G01 - MEASURING TESTING