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Jeong K. NA
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Centerville, OH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nondestructive inspection apparatus and methods of use
Patent number
11,047,831
Issue date
Jun 29, 2021
Kellogg Brown & Root LLC
Jeong-Kwan Na
G01 - MEASURING TESTING
Information
Patent Grant
Elastomer ultrasonic coupling adaptor for focused transducers
Patent number
10,794,871
Issue date
Oct 6, 2020
The United States of America as represented by the Secretary of the Air Force
James L. Blackshire
G01 - MEASURING TESTING
Information
Patent Grant
Micro-resolution ultrasonic nondestructive imaging method
Patent number
10,761,066
Issue date
Sep 1, 2020
KBR WYLE Services, LLC
Jeong K. Na
G01 - MEASURING TESTING
Information
Patent Grant
Phased array system for inspection of laser welds
Patent number
10,113,993
Issue date
Oct 30, 2018
Edison Welding Institute, Inc.
Roger Spencer
G01 - MEASURING TESTING
Information
Patent Grant
Gating methods for use in weld inspection systems
Patent number
9,759,691
Issue date
Sep 12, 2017
CUMBERLAND & WESTERN RESOURCES, LLC
Paul C. Boulware
G01 - MEASURING TESTING
Information
Patent Grant
Automated weld inspection system with weld acceptability pass or fa...
Patent number
9,733,219
Issue date
Aug 15, 2017
CUMBERLAND & WESTERN RESOURCES, LLC
Roger Spencer
G01 - MEASURING TESTING
Information
Patent Grant
Acoustic coupling shoes for use in inspecting non-flat surfaces
Patent number
9,360,461
Issue date
Jun 7, 2016
Edison Welding Institute, Inc.
Jeong Na
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional matrix phased array spot weld inspection system
Patent number
9,063,059
Issue date
Jun 23, 2015
Edison Welding Institute, Inc.
Jeong K. Na
G01 - MEASURING TESTING
Information
Patent Grant
Portable matrix phased array spot weld inspection system
Patent number
9,037,419
Issue date
May 19, 2015
Edison Welding Institute, Inc.
Jeong K. Na
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NONDESTRUCTIVE INSPECTION APPARATUS AND METHODS OF USE
Publication number
20210018470
Publication date
Jan 21, 2021
Kellogg Brown & Root LLC
Jeong-Kwan Na
G01 - MEASURING TESTING
Information
Patent Application
MICRO-RESOLUTION ULTRASONIC NONDESTRUCTIVE IMAGING METHOD
Publication number
20170370885
Publication date
Dec 28, 2017
WYLE LABORATORIES INC.
Jeong K. NA
G01 - MEASURING TESTING
Information
Patent Application
PHASED ARRAY SYSTEM FOR INSPECTION OF LASER WELDS
Publication number
20160320344
Publication date
Nov 3, 2016
EDISON WELDING INSTITUTE, INC.
Roger SPENCER
G01 - MEASURING TESTING
Information
Patent Application
GATING METHODS FOR USE IN WELD INSPECTION SYSTEMS
Publication number
20160231291
Publication date
Aug 11, 2016
EDISON WELDING INSTITUTE, INC.
Paul C. BOULWARE
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED WELD INSPECTION SYSTEM
Publication number
20150253288
Publication date
Sep 10, 2015
EWI, INC.
Roger SPENCER
G01 - MEASURING TESTING
Information
Patent Application
ACOUSTIC COUPLING SHOES FOR USE IN INSPECTING NON-FLAT SURFACES
Publication number
20140375169
Publication date
Dec 25, 2014
Edison Welding Institute
Jeong NA
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE MATRIX PHASED ARRAY SPOT WELD INSPECTION SYSTEM
Publication number
20140165730
Publication date
Jun 19, 2014
EDISON WELDING INSTITUTE
Jeong K. Na
G01 - MEASURING TESTING
Information
Patent Application
NON-DESTRUCTIVE THERMOGRAPHIC WELD INSPECTION
Publication number
20140095096
Publication date
Apr 3, 2014
EDISON WELDING INSTITUTE, INC.
Jeong K. NA
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL MATRIX PHASED ARRAY SPOT WELD INSPECTION SYSTEM
Publication number
20120310551
Publication date
Dec 6, 2012
EDISON WELDING INSTITUTE, INC.
Jeong K. Na
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive sensor based eddy current crack finder
Publication number
20060290349
Publication date
Dec 28, 2006
Wyle Laboratories, Inc.
Jeong K. Na
G01 - MEASURING TESTING