Jeongho AHN

Person

Gyeonggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 11,754,510
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device for performing wireless communication and wireles...
- Patent number 11,678,390
- Issue date Jun 13, 2023
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of inspecting substrate and method of fabricating...
- Patent number 10,393,672
- Issue date Aug 27, 2019
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling external electronic device and electronic de...
- Patent number 10,136,286
- Issue date Nov 20, 2018
- Samsung Electronics Co., Ltd.
- Bo-Ram Namgoong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate inspection apparatus
- Patent number 10,067,067
- Issue date Sep 4, 2018
- Samsung Electronics Co., Ltd.
- Seongsil Lee
- G01 - MEASURING TESTING
Information Patent Grant
Prism for inducing Brewster's angle transmission and fluorescence d...
- Patent number 8,237,925
- Issue date Aug 7, 2012
- KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Youngjoo Hong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE COMPRISING MOTOR HOUSING
- Publication number 20250147560
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Chungsoon PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING FOR ON-CELL OVERLAY MEASUREMENT
- Publication number 20250061560
- Publication date Feb 20, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL IMAGING DEVICE
- Publication number 20250027875
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE ELECTRONIC DEVICE
- Publication number 20240284621
- Publication date Aug 22, 2024
- Samsung Electronics Co., Ltd.
- Chungsoon PARK
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20240272089
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...
- Publication number 20240192154
- Publication date Jun 13, 2024
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRA...
- Publication number 20240151664
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Kwang-Eun KIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240077424
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Hyunwoo RYOO
- G01 - MEASURING TESTING
Information Patent Application
BATTERY RISK EVALUATION DEVICE AND OPERATING METHOD THEREOF
- Publication number 20240036118
- Publication date Feb 1, 2024
- Samsung Electronics Co., Ltd.
- Kyutae KIM
- G01 - MEASURING TESTING
Information Patent Application
BATTERY LIFE PREDICTION DEVICE AND OPERATING METHOD THEREOF
- Publication number 20240036119
- Publication date Feb 1, 2024
- Samsung Electronics Co., Ltd.
- Kyutae KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230384239
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE
- Publication number 20230332954
- Publication date Oct 19, 2023
- Samsung Electronics Co., Ltd.
- Hyeongcheol LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING ELECTRONIC DEVICES AND ELECTRONIC DEVICE THE...
- Publication number 20230236649
- Publication date Jul 27, 2023
- Samsung Electronics Co., Ltd.
- Jeongho AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230123710
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE FOR PERFORMING WIRELESS COMMUNICATION AND WIRELES...
- Publication number 20210227603
- Publication date Jul 22, 2021
- Samsung Electronics Co., Ltd.
- Jeongho AHN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...
- Publication number 20190033232
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- JEONGHO AHN
- G02 - OPTICS
Information Patent Application
SUBSTRATE INSPECTION APPARATUS
- Publication number 20170067833
- Publication date Mar 9, 2017
- Samsung Electronics Co., Ltd.
- Seongsil LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING EXTERNAL ELECTRONIC DEVICE AND ELECTRONIC DE...
- Publication number 20170006149
- Publication date Jan 5, 2017
- SAMSUNG ELECTRONICS CO., LTD.
- Bo-Ram NAMGOONG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Prism for inducing Brewster's angle transmission and fluorescence d...
- Publication number 20100225915
- Publication date Sep 9, 2010
- Korea Advanced Institute of Science and Technology
- Youngjoo Hong
- G01 - MEASURING TESTING

Jeongho AHN

Person

Patents Grantslast 30 patents

Inspection system of semiconductor wafer and method of driving the...

Inspection system of semiconductor wafer and method of driving the...

Electronic device for performing wireless communication and wireles...

System and method of inspecting substrate and method of fabricating...

Method for controlling external electronic device and electronic de...

Substrate inspection apparatus

Prism for inducing Brewster's angle transmission and fluorescence d...

Patents Applicationslast 30 patents

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

ELECTRONIC DEVICE COMPRISING MOTOR HOUSING

IMAGE PROCESSING FOR ON-CELL OVERLAY MEASUREMENT

OPTICAL IMAGING DEVICE

WEARABLE ELECTRONIC DEVICE

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...

SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRA...

APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE

BATTERY RISK EVALUATION DEVICE AND OPERATING METHOD THEREOF

BATTERY LIFE PREDICTION DEVICE AND OPERATING METHOD THEREOF

INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...

APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE

METHOD FOR CONTROLLING ELECTRONIC DEVICES AND ELECTRONIC DEVICE THE...

INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...

ELECTRONIC DEVICE FOR PERFORMING WIRELESS COMMUNICATION AND WIRELES...

SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...

SUBSTRATE INSPECTION APPARATUS

METHOD FOR CONTROLLING EXTERNAL ELECTRONIC DEVICE AND ELECTRONIC DE...

Prism for inducing Brewster's angle transmission and fluorescence d...