Jeremy Lansford

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for controlling etch selectivity
- Patent number 7,456,110
- Issue date Nov 25, 2008
- Advanced Micro Devices, Inc.
- Jeremy S. Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for providing etch uniformity using zoned temp...
- Patent number 6,746,616
- Issue date Jun 8, 2004
- Advanced Micro Devices, Inc.
- H. Jim Fulford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical polishing with electrochemical control
- Patent number 6,722,942
- Issue date Apr 20, 2004
- Advanced Micro Devices, Inc.
- Christopher H. Lansford
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrochemically generated reactants for chemical mechanical plana...
- Patent number 6,689,258
- Issue date Feb 10, 2004
- Advanced Micro Devices, Inc.
- Christopher H. Lansford
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Surface plasmon resonance-based endpoint detection for chemical mec...
- Patent number 6,613,594
- Issue date Sep 2, 2003
- Advanced Micro Devices, Inc.
- Christopher Hans Lansford
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for monitoring consumable performance
- Patent number 6,567,718
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- William J. Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for controlling deposition parameters based on polysilicon g...
- Patent number 6,511,898
- Issue date Jan 28, 2003
- Advanced Micro Devices Inc.
- Thomas Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feed-forward control of an etch processing tool
- Patent number 6,485,990
- Issue date Nov 26, 2002
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feedback control of strip time to reduce post strip critical dimens...
- Patent number 6,461,878
- Issue date Oct 8, 2002
- Advanced Micro Devices, Inc.
- Jeremy S. Lansford
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling photoresist baking processes
- Patent number 6,362,116
- Issue date Mar 26, 2002
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of endpointing plasma strip process by measuring wafer tempe...
- Patent number 6,352,870
- Issue date Mar 5, 2002
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining a polishing recipe based upon the measured p...
- Patent number 6,350,179
- Issue date Feb 26, 2002
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Feedback control of polish buff time as a function of scratch count
- Patent number 6,335,286
- Issue date Jan 1, 2002
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- B24 - GRINDING POLISHING
Information Patent Grant
Feedback control of deposition thickness based on polish planarization
- Patent number 6,291,253
- Issue date Sep 18, 2001
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- B24 - GRINDING POLISHING
Information Patent Grant
Ion implanter with multi-level vacuum
- Patent number 6,285,133
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- Christopher H. Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling within-wafer uniformity in che...
- Patent number 6,276,989
- Issue date Aug 21, 2001
- Advanced Micro Devices, Inc.
- W. Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for characterizing polish pad lots to eliminate or reduce to...
- Patent number 6,217,412
- Issue date Apr 17, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for determining a polishing recipe based upon the measured p...
- Patent number 6,213,848
- Issue date Apr 10, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Reduced variation in interconnect resistance using run-to-run contr...
- Patent number 6,157,078
- Issue date Dec 5, 2000
- Advanced Micro Devices, Inc.
- Jeremy Lansford
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for controlling etch selectivity
- Publication number 20050098535
- Publication date May 12, 2005
- Advanced Micro Devices, Inc.
- Jeremy S. Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining a polishing recipe based upon the measured p...
- Publication number 20010000773
- Publication date May 3, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING

Jeremy Lansford

Person

Patents Grantslast 30 patents

Method and apparatus for controlling etch selectivity

Method and apparatus for providing etch uniformity using zoned temp...

Chemical mechanical polishing with electrochemical control

Electrochemically generated reactants for chemical mechanical plana...

Surface plasmon resonance-based endpoint detection for chemical mec...

Method and apparatus for monitoring consumable performance

Method for controlling deposition parameters based on polysilicon g...

Feed-forward control of an etch processing tool

Feedback control of strip time to reduce post strip critical dimens...

Method for controlling photoresist baking processes

Method of endpointing plasma strip process by measuring wafer tempe...

Method for determining a polishing recipe based upon the measured p...

Feedback control of polish buff time as a function of scratch count

Feedback control of deposition thickness based on polish planarization

Ion implanter with multi-level vacuum

Method and apparatus for controlling within-wafer uniformity in che...

Method for characterizing polish pad lots to eliminate or reduce to...

Method for determining a polishing recipe based upon the measured p...

Reduced variation in interconnect resistance using run-to-run contr...

Patents Applicationslast 30 patents

Method and apparatus for controlling etch selectivity

Method for determining a polishing recipe based upon the measured p...