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Jerzy Ruzyllo
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State College, PA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Mist fabrication of quantum dot devices
Patent number
8,222,061
Issue date
Jul 17, 2012
The Penn State Research Foundation
Jian Xu
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,967,490
Issue date
Nov 22, 2005
QC Solutions, Inc.
Emil Kamieniecki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,924,657
Issue date
Aug 2, 2005
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Controlled etching of oxides via gas phase reactions
Patent number
RE38760
Issue date
Jul 19, 2005
Penn State Research Foundation
Robert W. Grant
438 - Semiconductor device manufacturing: process
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
6,909,302
Issue date
Jun 21, 2005
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Method for real-time in-line testing of semiconductor wafers
Patent number
6,315,574
Issue date
Nov 13, 2001
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Method for real-time in-line testing of semiconductor wafers
Patent number
6,069,017
Issue date
May 30, 2000
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Real-time in-line testing of semiconductor wafers
Patent number
5,661,408
Issue date
Aug 26, 1997
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Grant
Controlled etching of oxides via gas phase reactions
Patent number
5,439,553
Issue date
Aug 8, 1995
Penn State Research Foundation
Robert W. Grant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for etching oxide films in a sealed photochemical reactor
Patent number
5,234,540
Issue date
Aug 10, 1993
SubMicron Systems, Inc.
Robert W. Grant
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MIST FABRICATION OF QUANTUM DOT DEVICES
Publication number
20080238294
Publication date
Oct 2, 2008
The Penn State Research Foundation
Jian Xu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Real-time in-line testing of semiconductor wafers
Publication number
20040046585
Publication date
Mar 11, 2004
QC Solutions, Inc.
Emil Kamieniecki
G01 - MEASURING TESTING
Information
Patent Application
Real-time in-line testing of semiconductor wafers
Publication number
20020006740
Publication date
Jan 17, 2002
Emil Kamieniecki
G01 - MEASURING TESTING