Jianhua Qi

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Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Universal semiconductor-based automatic highspeed serial signal tes...
- Patent number 11,336,554
- Issue date May 17, 2022
- Sino IC Technology Co., Ltd.
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
IC test information management system based on industrial internet
- Patent number 11,042,680
- Issue date Jun 22, 2021
- Sino IC Technology Co., Ltd.
- Bin Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Embedded LED downlight
- Patent number 10,393,359
- Issue date Aug 27, 2019
- SHANGHAI HAIFENG ELECTRICAL LIGHTING CO., LTD
- Jianhua Qi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus with physical separation feature
- Patent number 8,878,545
- Issue date Nov 4, 2014
- Sino IC Technology Co., Ltd.
- Jie Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...
- Publication number 20230080214
- Publication date Mar 16, 2023
- SINO IC TECHNOLOGY CO., LTD.
- Kun YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIVERSAL SEMICONDUCTOR-BASED AUTOMATIC HIGH-SPEED SERIAL SIGNAL TE...
- Publication number 20200313998
- Publication date Oct 1, 2020
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST
- Publication number 20200309845
- Publication date Oct 1, 2020
- Hua Wang
- G01 - MEASURING TESTING
Information Patent Application
IC TEST INFORMATION MANAGEMENT SYSTEM BASED ON INDUSTRIAL INTERNET
- Publication number 20200089820
- Publication date Mar 19, 2020
- Sino IC Technology Co.,Ltd.
- Bin LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
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- Publication number 20190271460
- Publication date Sep 5, 2019
- SHANGHAI HAIFENG ELECTRICAL LIGHTING CO.,LTD
- Jianhua Qi
- F21 - LIGHTING
Information Patent Application
IEEE 1149.1 STANDARD BASED TESTING METHODS USED IN PACKAGING
- Publication number 20160223612
- Publication date Aug 4, 2016
- SINO IC TECHNOLOGY CO., LTD.
- Shouyin YE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COMPRESSING TEST FILE
- Publication number 20140114935
- Publication date Apr 24, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Hui Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE
- Publication number 20140070816
- Publication date Mar 13, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Jie Zhang
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Universal semiconductor-based automatic highspeed serial signal tes...

IC test information management system based on industrial internet

Embedded LED downlight

Test apparatus with physical separation feature

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...

UNIVERSAL SEMICONDUCTOR-BASED AUTOMATIC HIGH-SPEED SERIAL SIGNAL TE...

OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST

IC TEST INFORMATION MANAGEMENT SYSTEM BASED ON INDUSTRIAL INTERNET

Embedded LED Downlight

IEEE 1149.1 STANDARD BASED TESTING METHODS USED IN PACKAGING

METHOD OF COMPRESSING TEST FILE

TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE