Jianmin Wang

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and optical profiler
- Patent number 7,916,308
- Issue date Mar 29, 2011
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Quadrature phase shift interferometer (QPSI) decoder and method of...
- Patent number 7,092,100
- Issue date Aug 15, 2006
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and arrangement for topographically characterizing a surface...
- Patent number 7,064,841
- Issue date Jun 20, 2006
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and arrangement for removing noise and measurements of head-...
- Patent number 7,050,173
- Issue date May 23, 2006
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Dual-beam interferometer for ultra-smooth surface topographical mea...
- Patent number 7,019,840
- Issue date Mar 28, 2006
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Quadrature phase shift interferometer with unwrapping of phase
- Patent number 6,741,357
- Issue date May 25, 2004
- Seagate Technology LLC
- Jianmin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Dual module RWW tape head assembly
- Patent number 6,690,542
- Issue date Feb 10, 2004
- Seagate Removable Storage Solutions LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Particle removal tool with integrated defect detection/analysis cap...
- Publication number 20080024772
- Publication date Jan 31, 2008
- Seagate Technology LLC
- Li-Ping Wang
- G01 - MEASURING TESTING
Information Patent Application
Quadrature phase shift interferometer (QPSI) decoder and method of...
- Publication number 20050259769
- Publication date Nov 24, 2005
- Seagate Technology LLC
- Jianmin Wang
- G01 - MEASURING TESTING
Information Patent Application
Dual-beam interferometer for ultra-smooth surface topographical mea...
- Publication number 20040257582
- Publication date Dec 23, 2004
- Jianmin Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for removing noise and measurements of head-...
- Publication number 20040252393
- Publication date Dec 16, 2004
- Seagate Technology LLC
- Jianmin Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Optical profiler for ultra-smooth surface with normal incident beam...
- Publication number 20040196469
- Publication date Oct 7, 2004
- Seagate Technology LLC
- Jianmin Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for topographically characterizing a surface...
- Publication number 20040196468
- Publication date Oct 7, 2004
- Seagate Technology LLC
- Jianmin Wang
- G01 - MEASURING TESTING
Information Patent Application
Quadrature phase shift interferometer with unwrapping of phase
- Publication number 20030035113
- Publication date Feb 20, 2003
- Jianmin Wang
- G01 - MEASURING TESTING

Jianmin Wang

Person

Patents Grantslast 30 patents

Method and optical profiler

Quadrature phase shift interferometer (QPSI) decoder and method of...

Method and arrangement for topographically characterizing a surface...

Method and arrangement for removing noise and measurements of head-...

Dual-beam interferometer for ultra-smooth surface topographical mea...

Quadrature phase shift interferometer with unwrapping of phase

Dual module RWW tape head assembly

Patents Applicationslast 30 patents

Particle removal tool with integrated defect detection/analysis cap...

Quadrature phase shift interferometer (QPSI) decoder and method of...

Dual-beam interferometer for ultra-smooth surface topographical mea...

Method and arrangement for removing noise and measurements of head-...

Optical profiler for ultra-smooth surface with normal incident beam...

Method and arrangement for topographically characterizing a surface...

Quadrature phase shift interferometer with unwrapping of phase