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Jingmin Leng
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Fremont, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Systems and methods for analyzing defects in CVD films
Patent number
11,699,623
Issue date
Jul 11, 2023
Applied Materials, Inc.
Mandar B. Pandit
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Scatterometry multi-structure shape definition with multi-periodicity
Patent number
7,747,424
Issue date
Jun 29, 2010
KLA-Tencor Corporation
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Grant
Analysis of interface layer characteristics
Patent number
6,465,265
Issue date
Oct 15, 2002
Therma-Wave, Inc.
Jon Opsal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TREATMENT METHODS FOR SILICON NANOSHEET SURFACES
Publication number
20240055265
Publication date
Feb 15, 2024
Applied Materials, Inc.
Pradeep SAMPATH KUMAR
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR ANALYZING DEFECTS IN CVD FILMS
Publication number
20230352349
Publication date
Nov 2, 2023
Applied Materials, Inc.
Mandar B. Pandit
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SYSTEMS AND METHODS FOR ANALYZING DEFECTS IN CVD FILMS
Publication number
20220115275
Publication date
Apr 14, 2022
Applied Materials, Inc.
Mandar B. Pandit
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Scatterometry multi-structure shape definition with multi-periodicity
Publication number
20070219737
Publication date
Sep 20, 2007
Jon Opsal
G01 - MEASURING TESTING
Information
Patent Application
Analysis of interface layer characteristics
Publication number
20020045282
Publication date
Apr 18, 2002
Jon Opsal
G01 - MEASURING TESTING