Joachim Moll

Person

Herrenberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Digital signal analysis with evaluation of selected signal bits
- Patent number 8,374,227
- Issue date Feb 12, 2013
- Agilent Technologies, Inc.
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit with bit error test capability
- Patent number 7,620,515
- Issue date Nov 17, 2009
- Agilent Technologies, Inc.
- Martin Heinen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital data signal testing using arbitrary test signal
- Patent number 7,610,520
- Issue date Oct 27, 2009
- Agilent Technologies, Inc.
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Grant
Determination of a jitter property of a signal
- Patent number 7,519,489
- Issue date Apr 14, 2009
- Agilent Technologies, Inc.
- Guenter Tietz
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Performing a signal analysis based on digital samples in conjunctio...
- Patent number 7,495,591
- Issue date Feb 24, 2009
- Agilent Technologies, Inc.
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Grant
Noise signal generation by mapping random words
- Patent number 7,479,837
- Issue date Jan 20, 2009
- Agilent Technologies, Inc.
- Martin Muecke
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pin coupler for an integrated circuit tester
- Patent number 7,240,259
- Issue date Jul 3, 2007
- Verigy (Singapore) Pte. Ltd.
- Markus Rottacker
- G01 - MEASURING TESTING
Information Patent Grant
Signal sampling with sampling and reference paths
- Patent number 7,069,488
- Issue date Jun 27, 2006
- Agilent Technologies, Inc.
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay unit for periodic signals
- Patent number 6,977,538
- Issue date Dec 20, 2005
- Agilent Technologies, Inc.
- Joachim Moll
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency-providing circuit
- Patent number 6,177,845
- Issue date Jan 23, 2001
- Hewlett-Packard Company
- Joachim Moll
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Variable digital delay line
- Patent number 6,127,871
- Issue date Oct 3, 2000
- Hewlett-Packard Company
- Joachim Moll
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Digital signal analysis with evaluation of selected signal bits
- Publication number 20080181289
- Publication date Jul 31, 2008
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Performing a signal analysis based on digital samples in conjunctio...
- Publication number 20080001798
- Publication date Jan 3, 2008
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Application
Digital data signal analysis by evaluating sampled values in conjun...
- Publication number 20070250279
- Publication date Oct 25, 2007
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Application
Arbitrary pulse generation
- Publication number 20070195877
- Publication date Aug 23, 2007
- Martin Muecke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Digital data signal testing using arbitrary test signal
- Publication number 20070185668
- Publication date Aug 9, 2007
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with bit error test capability
- Publication number 20070159234
- Publication date Jul 12, 2007
- Martin Heinen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Determination of a jitter property of a signal
- Publication number 20070098126
- Publication date May 3, 2007
- Guenter Tietz
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Noise signal generation by mapping random words
- Publication number 20070024384
- Publication date Feb 1, 2007
- Martin Muecke
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal generation
- Publication number 20060282715
- Publication date Dec 14, 2006
- Joachim Moll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Signal shaping circuit
- Publication number 20060280239
- Publication date Dec 14, 2006
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Pin coupler for an integrated circuit tester
- Publication number 20050246603
- Publication date Nov 3, 2005
- Markus Rottacker
- G01 - MEASURING TESTING
Information Patent Application
Delay unit for periodic signals
- Publication number 20040075482
- Publication date Apr 22, 2004
- Joachim Moll
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal sampling with sampling and reference paths
- Publication number 20040039552
- Publication date Feb 26, 2004
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Signal sampling with clock recovery
- Publication number 20040022337
- Publication date Feb 5, 2004
- AGILENT TECHNOLOGIES, INC.
- Joachim Moll
- G01 - MEASURING TESTING
Information Patent Application
Jitter generation with delay unit
- Publication number 20030041294
- Publication date Feb 27, 2003
- AGILENT TECHNOLOGIES, INC.
- Joachim Moll
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Joachim Moll

Person

Patents Grantslast 30 patents

Digital signal analysis with evaluation of selected signal bits

Integrated circuit with bit error test capability

Digital data signal testing using arbitrary test signal

Determination of a jitter property of a signal

Performing a signal analysis based on digital samples in conjunctio...

Noise signal generation by mapping random words

Pin coupler for an integrated circuit tester

Signal sampling with sampling and reference paths

Delay unit for periodic signals

Frequency-providing circuit

Variable digital delay line

Patents Applicationslast 30 patents

Digital signal analysis with evaluation of selected signal bits

Performing a signal analysis based on digital samples in conjunctio...

Digital data signal analysis by evaluating sampled values in conjun...

Arbitrary pulse generation

Digital data signal testing using arbitrary test signal

Integrated circuit with bit error test capability

Determination of a jitter property of a signal

Noise signal generation by mapping random words

Signal generation

Signal shaping circuit

Pin coupler for an integrated circuit tester

Delay unit for periodic signals

Signal sampling with sampling and reference paths

Signal sampling with clock recovery

Jitter generation with delay unit