Jody J. Van Horn

Person

Underhill, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diversified exerciser and accelerator
- Patent number 9,535,113
- Issue date Jan 3, 2017
- International Business Machines Corporation
- David A. Grosch
- G01 - MEASURING TESTING
Information Patent Grant
Programmable active thermal control
- Patent number 9,152,517
- Issue date Oct 6, 2015
- International Business Machines Corporation
- Harold Chase
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,759,960
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,564,256
- Issue date Jul 21, 2009
- International Business Machines Company
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing method using well bias modification
- Patent number 7,486,098
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Testing using independently controllable voltage islands
- Patent number 7,428,675
- Issue date Sep 23, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing methods using well bias modification
- Patent number 7,400,162
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 7,298,161
- Issue date Nov 20, 2007
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Device burn in utilizing voltage control
- Patent number 7,265,561
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit phase partitioned power distribution for stress...
- Patent number 7,000,162
- Issue date Feb 14, 2006
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 6,891,359
- Issue date May 10, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
AC defect detection and failure avoidance power up and diagnostic s...
- Patent number 6,763,314
- Issue date Jul 13, 2004
- International Business Machines Corporation
- Phillip J. Nigh
- G01 - MEASURING TESTING
Information Patent Grant
Method for test optimization using historical and actual fabricatio...
- Patent number 6,618,682
- Issue date Sep 9, 2003
- International Business Machines Corporation
- Raymond J. Bulaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 6,351,134
- Issue date Feb 26, 2002
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 5,929,651
- Issue date Jul 27, 1999
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for burn-in stressing and simultaneous testin...
- Patent number 5,923,181
- Issue date Jul 13, 1999
- International Business Machine Corporation
- Kenneth Edward Beilstein
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for burn-in stressing and simultaneous testin...
- Patent number 5,686,843
- Issue date Nov 11, 1997
- International Business Machines Corporation
- Kenneth Edward Beilstein
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 5,600,257
- Issue date Feb 4, 1997
- International Business Machines Corporation
- James M. Leas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE ACTIVE THERMAL CONTROL
- Publication number 20120272100
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Harold Chase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Testing Using Independently Controllable Voltage Islands
- Publication number 20080284459
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080211530
- Publication date Sep 4, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
- Publication number 20080036486
- Publication date Feb 14, 2008
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Testing using independently controllable voltage islands
- Publication number 20060158222
- Publication date Jul 20, 2006
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit testing methods using well bias modification
- Publication number 20060071653
- Publication date Apr 6, 2006
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Circuitry and methodology to establish correlation between gate die...
- Publication number 20050184720
- Publication date Aug 25, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
DEVICE BURN IN UTILIZING VOLTAGE CONTROL
- Publication number 20050068053
- Publication date Mar 31, 2005
- International Business Machines Corporation
- Dennis R. Conti
- G01 - MEASURING TESTING
Information Patent Application
Circuitry And Methodology To Establish Correlation Between Gate Die...
- Publication number 20040145384
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
AC defect detection and failure avoidance power up and diagnostic s...
- Publication number 20030065484
- Publication date Apr 3, 2003
- Phillip J. Nigh
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit phase partitioned power distribution for stress...
- Publication number 20030030460
- Publication date Feb 13, 2003
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Method for test optimization using historical and actual fabricatio...
- Publication number 20020155628
- Publication date Oct 24, 2002
- International Business Machines Corporation
- Raymond J. Bulaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TEST AND BURN-IN
- Publication number 20020003432
- Publication date Jan 10, 2002
- JAMES MARC LEAS
- G01 - MEASURING TESTING

Jody J. Van Horn

Person

Patents Grantslast 30 patents

Diversified exerciser and accelerator

Programmable active thermal control

Integrated circuit testing methods using well bias modification

Integrated circuit testing methods using well bias modification

Integrated circuit testing method using well bias modification

Testing using independently controllable voltage islands

Integrated circuit testing methods using well bias modification

Circuitry and methodology to establish correlation between gate die...

Device burn in utilizing voltage control

Integrated circuit phase partitioned power distribution for stress...

Circuitry and methodology to establish correlation between gate die...

AC defect detection and failure avoidance power up and diagnostic s...

Method for test optimization using historical and actual fabricatio...

Semiconductor wafer test and burn-in

Semiconductor wafer test and burn-in

Methods and apparatus for burn-in stressing and simultaneous testin...

Methods and apparatus for burn-in stressing and simultaneous testin...

Semiconductor wafer test and burn-in

Patents Applicationslast 30 patents

PROGRAMMABLE ACTIVE THERMAL CONTROL

Testing Using Independently Controllable Voltage Islands

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION

Testing using independently controllable voltage islands

Integrated circuit testing methods using well bias modification

Circuitry and methodology to establish correlation between gate die...

DEVICE BURN IN UTILIZING VOLTAGE CONTROL

Circuitry And Methodology To Establish Correlation Between Gate Die...

AC defect detection and failure avoidance power up and diagnostic s...

Integrated circuit phase partitioned power distribution for stress...

Method for test optimization using historical and actual fabricatio...

SEMICONDUCTOR WAFER TEST AND BURN-IN