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Joe L. Phillips
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Nampa, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
7,102,737
Issue date
Sep 5, 2006
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Rotating gripper wafer flipper
Patent number
6,937,005
Issue date
Aug 30, 2005
Micron Technology, Inc.
Willard L. Hofer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rotating gripper wafer flipper
Patent number
6,909,276
Issue date
Jun 21, 2005
Micron Technology, Inc.
Willard L. Hofer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,831,734
Issue date
Dec 14, 2004
Micron Technology, Inc.
Mark Eyolfsou
G01 - MEASURING TESTING
Information
Patent Grant
Rotating gripper wafer flipper
Patent number
6,828,772
Issue date
Dec 7, 2004
Micron Technology, Inc.
Willard L. Hofer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,704,107
Issue date
Mar 9, 2004
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus employing external light source for endpoint d...
Patent number
6,429,928
Issue date
Aug 6, 2002
Micron Technology, Inc.
David R. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,369,887
Issue date
Apr 9, 2002
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,256,094
Issue date
Jul 3, 2001
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Automated light tuner
Patent number
6,179,448
Issue date
Jan 30, 2001
Micron Technology, Inc.
David R. Johnson
G02 - OPTICS
Information
Patent Grant
Method and apparatus employing external light source for endpoint d...
Patent number
5,969,805
Issue date
Oct 19, 1999
Micron Technology, Inc.
David R. Johnson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Rotating gripper wafer flipper
Publication number
20060046376
Publication date
Mar 2, 2006
Willard L. Hofer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Rotating gripper wafer flipper
Publication number
20050030008
Publication date
Feb 10, 2005
Willard L. Hofer
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Rotating gripper wafer flipper
Publication number
20050026324
Publication date
Feb 3, 2005
Willard L. Hofer
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20040224429
Publication date
Nov 11, 2004
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20020093642
Publication date
Jul 18, 2002
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS EMPLOYING EXTERNAL LIGHT SOURCE FOR ENDPOINT D...
Publication number
20010046043
Publication date
Nov 29, 2001
DAVID R. JOHNSON
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20010013930
Publication date
Aug 16, 2001
Mark Eyolfson
G01 - MEASURING TESTING