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Joel C. Mitchell
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Bridgman, MI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Reagent tube for top loading analyzer
Patent number
7,497,991
Issue date
Mar 3, 2009
Leco Corporation
Steven J. Rohaly
G01 - MEASURING TESTING
Information
Patent Grant
Multi-reflecting time-of-flight mass spectrometer and method of use
Patent number
7,385,187
Issue date
Jun 10, 2008
Leco Corporation
Anatoli Verentchikov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analyzer with variable volume ballast chamber and method of analysis
Patent number
7,070,738
Issue date
Jul 4, 2006
Leco Corporation
Joel C. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing system for high accuracy nitrogen determination
Patent number
6,623,699
Issue date
Sep 23, 2003
Leco Corporation
Brian W. Pack
G01 - MEASURING TESTING
Information
Patent Grant
Analytical crucible
Patent number
6,270,727
Issue date
Aug 7, 2001
Leco Corporation
Joel C. Mitchell
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Atmospheric seal for glow discharge analytical instrument
Patent number
5,646,726
Issue date
Jul 8, 1997
Leco Corporation
Joel C. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Glow discharge analytical instrument for performing excitation and...
Patent number
5,408,315
Issue date
Apr 18, 1995
Leco Corporation
Joel C. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Power control circuit for inductively coupled plasma atomic emissio...
Patent number
5,155,547
Issue date
Oct 13, 1992
Leco Corporation
Ted J. Casper
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Analyzer with top-loading reagent tube
Publication number
20070172391
Publication date
Jul 26, 2007
Steven J. Rohaly
G01 - MEASURING TESTING
Information
Patent Application
Analyzer with variable volume ballast chamber and method of analysis
Publication number
20040171165
Publication date
Sep 2, 2004
Joel C. Mitchell
G01 - MEASURING TESTING