Membership
Tour
Register
Log in
Joel O. Stevenson
Follow
Person
Albuquerque, NM, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method & apparatus for monitoring plasma processing operations
Patent number
6,805,810
Issue date
Oct 19, 2004
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and assembly for detecting a leak in a plasma system
Patent number
6,769,288
Issue date
Aug 3, 2004
Peak Sensor Systems LLC
Pamela Peardon Denise Ward
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,419,801
Issue date
Jul 16, 2002
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,383,402
Issue date
May 7, 2002
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,275,740
Issue date
Aug 14, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,269,278
Issue date
Jul 31, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,261,470
Issue date
Jul 17, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,254,717
Issue date
Jul 3, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,246,473
Issue date
Jun 12, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,223,755
Issue date
May 1, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,221,679
Issue date
Apr 24, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,192,826
Issue date
Feb 27, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,169,933
Issue date
Jan 2, 2001
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,165,312
Issue date
Dec 26, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,157,447
Issue date
Dec 5, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,134,005
Issue date
Oct 17, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,132,577
Issue date
Oct 17, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,123,983
Issue date
Sep 26, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,090,302
Issue date
Jul 18, 2000
Sandia
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring plasma processing operations
Patent number
6,077,386
Issue date
Jun 20, 2000
Sandia Corporation
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Grant
Electrochemical method for defect delineation in silicon-on-insulat...
Patent number
5,015,346
Issue date
May 14, 1991
United States Department of Energy
Terry R. Guilinger
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Porous siliconformation and etching process for use in silicon micr...
Patent number
4,995,954
Issue date
Feb 26, 1991
The United States of America as represented by the Department of Energy
Terry R. Guilinger
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and assembly for detecting a leak in a plasma system
Publication number
20040083797
Publication date
May 6, 2004
Pamela Peardon Denise Ward
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring plasma processing operations
Publication number
20030136663
Publication date
Jul 24, 2003
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Application
Method & apparatus for monitoring plasma processing operations
Publication number
20030029720
Publication date
Feb 13, 2003
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Application
Method & apparatus for monitoring plasma processing operations
Publication number
20030024810
Publication date
Feb 6, 2003
Michael Lane Smith
G01 - MEASURING TESTING
Information
Patent Application
Method & apparatus for monitoring plasma processing operations
Publication number
20030019840
Publication date
Jan 30, 2003
Michael Lane Smith
G01 - MEASURING TESTING