Joerg Steinert

Person

Jena, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Optoelectronic detector, in particular for high-resolution light sc...
- Patent number 10,197,729
- Issue date Feb 5, 2019
- Carl Zeiss Microscopy GmbH
- Joerg Steinert
- G02 - OPTICS
Information Patent Grant
Laser scanning microscope
- Patent number 8,599,480
- Issue date Dec 3, 2013
- Carl Zeiss Microscopy GmbH
- Matthias Danckwerts
- G02 - OPTICS
Information Patent Grant
Calibration device and laser scanning microscope with such a calibr...
- Patent number 8,115,164
- Issue date Feb 14, 2012
- Carl Zeiss MicroImaging GmbH
- Ralf Netz
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting a control of an optical scanner and the optic...
- Patent number 8,013,288
- Issue date Sep 6, 2011
- Carl Zeiss MicroImaging GmbH
- Joerg Steinert
- G02 - OPTICS
Information Patent Grant
Optical zoom system for a light scanning microscope
- Patent number 7,888,628
- Issue date Feb 15, 2011
- Carl Zeiss MicroImaging GmbH
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Grant
Spectral analysis unit with a diffraction grating
- Patent number 7,852,474
- Issue date Dec 14, 2010
- Carl Zeiss MicroImaging GmbH
- Hans-Juergen Dobschal
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanner control in at least one scan axis in a laser sca...
- Patent number 7,796,149
- Issue date Sep 14, 2010
- Carl Zeiss MicroImaging GmbH
- Joerg Steinert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Correction device for an optical arrangement and confocal microscop...
- Patent number 7,692,879
- Issue date Apr 6, 2010
- Carl Zeiss MicroImaging GmbH
- Joerg Steinert
- G02 - OPTICS
Information Patent Grant
Method for correcting a control of an optical scanner in a device f...
- Patent number 7,679,045
- Issue date Mar 16, 2010
- Carl Zeiss MicroImaging GmbH
- Joerg Steinert
- G02 - OPTICS
Information Patent Grant
Process for the observation of at least one sample region with a li...
- Patent number 7,649,683
- Issue date Jan 19, 2010
- Carl Zeiss MicroImaging GmbH
- Ralf Engelmann
- G02 - OPTICS
Information Patent Grant
Light scanning microscope and use
- Patent number 7,561,326
- Issue date Jul 14, 2009
- Carl Zeiss MicroImaging GmbH
- Joerg-Michael Funk
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanning microscope
- Patent number 7,554,664
- Issue date Jun 30, 2009
- Carl Zeiss MicroImaging GmbH
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Grant
Optical zoom system for a light scanning electron microscope
- Patent number 7,488,931
- Issue date Feb 10, 2009
- Carl Zeiss Jena GmbH
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Grant
Process for the observation of at least one sample region with a li...
- Patent number 7,459,698
- Issue date Dec 2, 2008
- Carl Zeiss MicroImaging GmbH
- Ralf Engelmann
- G02 - OPTICS
Information Patent Grant
Optical zoom system for a light scanning electron microscope
- Patent number 7,369,305
- Issue date May 6, 2008
- Carl Zeiss Jena GmbH
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Grant
Process for the observation of at least one sample region with a li...
- Patent number 7,271,382
- Issue date Sep 18, 2007
- Carl Zeiss Jena GmbH
- Ralf Engelmann
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CORRECTING MEASUREMENT VALUES OF AN OPTICAL DETECTION CH...
- Publication number 20250008234
- Publication date Jan 2, 2025
- CARL ZEISS MICROSCOPY GMBH
- Dieter Huhse
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and device for microscopy
- Publication number 20240168272
- Publication date May 23, 2024
- CARL ZEISS MICROSCOPY GMBH
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
Method and Device for Microscopy
- Publication number 20240053594
- Publication date Feb 15, 2024
- CARL ZEISS MICROSCOPY GMBH
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
OPTOELECTRONIC DETECTOR, IN PARTICULAR FOR HIGH-RESOLUTION LIGHT SC...
- Publication number 20160209588
- Publication date Jul 21, 2016
- CARL ZEISS MICROSCOPY GMBH
- Joerg STEINERT
- G02 - OPTICS
Information Patent Application
LASER SCANNING MICROSCOPE
- Publication number 20140293410
- Publication date Oct 2, 2014
- CARL ZEISS MICROSCOPY GMBH
- Matthias Danckwerts
- G02 - OPTICS
Information Patent Application
METHOD FOR CORRECTING A CONTROL OF AN OPTICAL SCANNER AND THE OPTIC...
- Publication number 20100321752
- Publication date Dec 23, 2010
- CARL ZEISS MICROIMAGING GMBH
- Joerg STEINERT
- G02 - OPTICS
Information Patent Application
LASER SCANNING MICROSCOPE
- Publication number 20100188741
- Publication date Jul 29, 2010
- Matthias Danckwerts
- G02 - OPTICS
Information Patent Application
Optical zoom system for a light scanning electron microscope
- Publication number 20090236522
- Publication date Sep 24, 2009
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Calibration device and laser scanning microscope with such a calibr...
- Publication number 20090224174
- Publication date Sep 10, 2009
- Ralf Netz
- G02 - OPTICS
Information Patent Application
Method for correcting a control of an optical scanner in a device f...
- Publication number 20090008539
- Publication date Jan 8, 2009
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
Laser scanning microscope
- Publication number 20080024782
- Publication date Jan 31, 2008
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Correction device for an optical arrangement and confocal microscop...
- Publication number 20070253044
- Publication date Nov 1, 2007
- Carl Zeiss Jena GmbH
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
Correction device for an optical arrangement and confocal microscop...
- Publication number 20070253046
- Publication date Nov 1, 2007
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
Spectral analytical unit with a diffraction grating
- Publication number 20070242268
- Publication date Oct 18, 2007
- Hans-Juergen Dobschal
- G02 - OPTICS
Information Patent Application
Method for scanner control in at least one scan axis in a laser sca...
- Publication number 20070146472
- Publication date Jun 28, 2007
- Joerg Steinert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Process for the observation of at least one sample region with a li...
- Publication number 20070131875
- Publication date Jun 14, 2007
- Carl Zeiss Jena GmbH
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Method for correcting a control of an optical scanner and the optic...
- Publication number 20070086048
- Publication date Apr 19, 2007
- Joerg Steinert
- G02 - OPTICS
Information Patent Application
Optical zoom system for a light scanning electron microscope
- Publication number 20070076293
- Publication date Apr 5, 2007
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Laser scanning microscope
- Publication number 20060273261
- Publication date Dec 7, 2006
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Optical zoom system for a light scanning electron microscope
- Publication number 20060049343
- Publication date Mar 9, 2006
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Light scanning microscope point-shaped light source distribution an...
- Publication number 20060012862
- Publication date Jan 19, 2006
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Process for the observation of at least one sample region with a li...
- Publication number 20060011804
- Publication date Jan 19, 2006
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Process for the observation of at least one sample region with a li...
- Publication number 20060011858
- Publication date Jan 19, 2006
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Light scanning electron microscope and use
- Publication number 20060012785
- Publication date Jan 19, 2006
- Joerg-Michael Funk
- G02 - OPTICS
Information Patent Application
Process for the observation of at least one sample region with a li...
- Publication number 20060011824
- Publication date Jan 19, 2006
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Optical zoom system for a light scanning electron microscope
- Publication number 20060011832
- Publication date Jan 19, 2006
- Ralf Wolleschensky
- G02 - OPTICS
Information Patent Application
Light scanning microscope with line-by-line scanning and use
- Publication number 20060012870
- Publication date Jan 19, 2006
- Ralf Engelmann
- G02 - OPTICS
Information Patent Application
Light scanning electron microscope and use
- Publication number 20060012871
- Publication date Jan 19, 2006
- Joerg-Michael Funk
- G02 - OPTICS
Information Patent Application
Correction device for an optical arrangement and confocal microscop...
- Publication number 20060012892
- Publication date Jan 19, 2006
- Joerg Steinert
- G02 - OPTICS

Joerg Steinert

Person

Patents Grantslast 30 patents

Optoelectronic detector, in particular for high-resolution light sc...

Laser scanning microscope

Calibration device and laser scanning microscope with such a calibr...

Method for correcting a control of an optical scanner and the optic...

Optical zoom system for a light scanning microscope

Spectral analysis unit with a diffraction grating

Method for scanner control in at least one scan axis in a laser sca...

Correction device for an optical arrangement and confocal microscop...

Method for correcting a control of an optical scanner in a device f...

Process for the observation of at least one sample region with a li...

Light scanning microscope and use

Laser scanning microscope

Optical zoom system for a light scanning electron microscope

Process for the observation of at least one sample region with a li...

Optical zoom system for a light scanning electron microscope

Process for the observation of at least one sample region with a li...

Patents Applicationslast 30 patents

METHOD FOR CORRECTING MEASUREMENT VALUES OF AN OPTICAL DETECTION CH...

Method and device for microscopy

Method and Device for Microscopy

OPTOELECTRONIC DETECTOR, IN PARTICULAR FOR HIGH-RESOLUTION LIGHT SC...

LASER SCANNING MICROSCOPE

METHOD FOR CORRECTING A CONTROL OF AN OPTICAL SCANNER AND THE OPTIC...

LASER SCANNING MICROSCOPE

Optical zoom system for a light scanning electron microscope

Calibration device and laser scanning microscope with such a calibr...

Method for correcting a control of an optical scanner in a device f...

Laser scanning microscope

Correction device for an optical arrangement and confocal microscop...

Correction device for an optical arrangement and confocal microscop...

Spectral analytical unit with a diffraction grating

Method for scanner control in at least one scan axis in a laser sca...

Process for the observation of at least one sample region with a li...

Method for correcting a control of an optical scanner and the optic...

Optical zoom system for a light scanning electron microscope

Laser scanning microscope

Optical zoom system for a light scanning electron microscope

Light scanning microscope point-shaped light source distribution an...

Process for the observation of at least one sample region with a li...

Process for the observation of at least one sample region with a li...

Light scanning electron microscope and use

Process for the observation of at least one sample region with a li...

Optical zoom system for a light scanning electron microscope

Light scanning microscope with line-by-line scanning and use

Light scanning electron microscope and use

Correction device for an optical arrangement and confocal microscop...