Johannes DeWilde

Person

Hilversum, NL

People

Patents Grantslast 30 patents

Information Patent Grant
High sensitivity magnetic built-in current sensor
- Patent number 7,619,431
- Issue date Nov 17, 2009
- NXP B.V.
- Johannes De Wilde
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with power supply test interface
- Patent number 6,812,690
- Issue date Nov 2, 2004
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and test method for protecting an IC against damage fr...
- Patent number 6,765,403
- Issue date Jul 20, 2004
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with test interface
- Patent number 6,664,798
- Issue date Dec 16, 2003
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Connection test method
- Patent number 6,297,643
- Issue date Oct 2, 2001
- U.S. Philips Corporation
- Franciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a connection which includes a conductor in an int...
- Patent number 5,963,038
- Issue date Oct 5, 1999
- U.S. Philips Corporation
- Franciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Testable circuit
- Patent number 5,781,559
- Issue date Jul 14, 1998
- U.S. Philips Corporation
- Mathias N. M. Muris
- G01 - MEASURING TESTING
Information Patent Grant
Testable carriers for integrated circuits
- Patent number 4,879,717
- Issue date Nov 7, 1989
- U.S. Philips Corp.
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuits, carriers therefor and testing apparatus and me...
- Patent number 4,791,358
- Issue date Dec 13, 1988
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a sensor having a magnetic field sensitive...
- Patent number 4,666,554
- Issue date May 19, 1987
- U.S. Philips Corporation
- Johannes De Wilde
- G11 - INFORMATION STORAGE
Information Patent Grant
Sensor having a magnetic field-sensitive element with accurately de...
- Patent number 4,568,906
- Issue date Feb 4, 1986
- U.S. Philips Corporation
- Johannes De Wilde
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing a magnetic head unit
- Patent number 4,435,900
- Issue date Mar 13, 1984
- U.S. Philips Corporation
- Johannes de Wilde
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head unit having thermally dissipating cover plate
- Patent number 4,429,337
- Issue date Jan 31, 1984
- U.S. Philips Corporation
- Johannes de Wilde
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
High sensitivity magnetic built-in current sensor
- Publication number 20070063690
- Publication date Mar 22, 2007
- Koninklijke Philips Electronic, N.V.
- Johannes De Wilde
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with power supply test interface
- Publication number 20020153876
- Publication date Oct 24, 2002
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
Test circuit and test method
- Publication number 20020149387
- Publication date Oct 17, 2002
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with test interface
- Publication number 20010015653
- Publication date Aug 23, 2001
- U.S. PHILIPS CORPORATION
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION TEST METHOD
- Publication number 20010013781
- Publication date Aug 16, 2001
- FRANCISCUS G.M. DE JONG
- G01 - MEASURING TESTING

Johannes DeWilde

Person

Patents Grantslast 30 patents

High sensitivity magnetic built-in current sensor

Integrated circuit with power supply test interface

Test circuit and test method for protecting an IC against damage fr...

Integrated circuit with test interface

Connection test method

Method of testing a connection which includes a conductor in an int...

Testable circuit

Testable carriers for integrated circuits

Integrated circuits, carriers therefor and testing apparatus and me...

Method of manufacturing a sensor having a magnetic field sensitive...

Sensor having a magnetic field-sensitive element with accurately de...

Method of manufacturing a magnetic head unit

Magnetic head unit having thermally dissipating cover plate

Patents Applicationslast 30 patents

High sensitivity magnetic built-in current sensor

Integrated circuit with power supply test interface

Test circuit and test method

Integrated circuit with test interface

CONNECTION TEST METHOD