John A. Notte, IV

Person

Gloucester, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gas field ion source with coated tip
- Patent number 8,314,403
- Issue date Nov 20, 2012
- Carl Zeiss NTS, LLC
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple current charged particle methods
- Patent number 8,227,753
- Issue date Jul 24, 2012
- Carl Zeiss NTS, LLC
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increasing current in charged particle sources and systems
- Patent number 8,124,941
- Issue date Feb 28, 2012
- Carl Zeiss NTS, LLC
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,110,814
- Issue date Feb 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion beam stabilization
- Patent number 8,093,563
- Issue date Jan 10, 2012
- Carl Zeiss NTS, LLC
- FHM-Faridur Rahman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample decontamination
- Patent number 8,013,300
- Issue date Sep 6, 2011
- Carl Zeiss NTS, LLC
- Lewis A. Stern
- G01 - MEASURING TESTING
Information Patent Grant
Determining dopant information
- Patent number 7,804,068
- Issue date Sep 28, 2010
- ALIS Corporation
- John A. Notte, IV
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,452
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,451
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,745,801
- Issue date Jun 29, 2010
- ALIS Corporation
- Billy W. Ward
Information Patent Grant
Systems and methods for a gas field ion microscope
- Patent number 7,601,953
- Issue date Oct 13, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,358
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,361
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,360
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,359
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,096
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,097
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,521,693
- Issue date Apr 21, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,518,122
- Issue date Apr 14, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,280
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,279
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,504,639
- Issue date Mar 17, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,495,232
- Issue date Feb 24, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,488,952
- Issue date Feb 10, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,485,873
- Issue date Feb 3, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Proximity deposition
- Patent number 6,926,935
- Issue date Aug 9, 2005
- FEI Company
- Jason Harrison Arjavac
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
GAS DELIVERY IN A MICROSCOPE SYSTEM
- Publication number 20120145896
- Publication date Jun 14, 2012
- CARL ZEISS NTS, LLC.
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE ENERGY CHARGED PARTICLE SYSTEMS
- Publication number 20120138815
- Publication date Jun 7, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
ION BEAM STABILIZATION
- Publication number 20120097849
- Publication date Apr 26, 2012
- CARL ZEISS NTS, LLC.
- FHM-Faridur Rahman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SO...
- Publication number 20120074318
- Publication date Mar 29, 2012
- CARL ZEISS NTS, LLC.
- John Notte, IV
- G05 - CONTROLLING REGULATING
Information Patent Application
CHARGED PARTICLE DETECTORS
- Publication number 20120068068
- Publication date Mar 22, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20110240853
- Publication date Oct 6, 2011
- CARL ZEISS NTS, LLC.
- Richard Comunale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20110139979
- Publication date Jun 16, 2011
- CARL ZEISS NTS, LLC.
- John A. Notte, IV
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DETECTION SYSTEMS AND METHODS
- Publication number 20110127428
- Publication date Jun 2, 2011
- CARL ZEISS NTS, LLC.
- Raymond Hill
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
- Publication number 20110121176
- Publication date May 26, 2011
- CARL ZEISS NTS, LLC.
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
REDUCING PARTICLE IMPLANTATION
- Publication number 20110049364
- Publication date Mar 3, 2011
- Carl Zeiss SMT Inc.
- Rainer Knippelmeyer
- G01 - MEASURING TESTING
Information Patent Application
GAS FIELD ION SOURCE WITH COATED TIP
- Publication number 20110001058
- Publication date Jan 6, 2011
- Carl Zeiss SMT Inc.
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ICE LAYERS IN CHARGED PARTICLE SYSTEMS AND METHODS
- Publication number 20100136255
- Publication date Jun 3, 2010
- Carl Zeiss SMT Inc.
- John A. Notte, IV
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM STABILIZATION
- Publication number 20100051805
- Publication date Mar 4, 2010
- Carl Zeiss SMT Inc.
- FHM-Faridur Rahman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CURRENT CHARGED PARTICLE METHODS
- Publication number 20100012837
- Publication date Jan 21, 2010
- Carl Zeiss SMT Inc.
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCREASING CURRENT IN CHARGED PARTICLE SOURCES AND SYSTEMS
- Publication number 20100012839
- Publication date Jan 21, 2010
- Carl Zeiss SMT Inc.
- John A. Notte, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE DECONTAMINATION
- Publication number 20090314939
- Publication date Dec 24, 2009
- Carl Zeiss SMT Inc.
- Lewis A. Stern
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20090179161
- Publication date Jul 16, 2009
- ALIS Corporation
- BILLY W. WARD
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20090114840
- Publication date May 7, 2009
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS

John A. Notte, IV

Person

Patents Grantslast 30 patents

Gas field ion source with coated tip

Multiple current charged particle methods

Increasing current in charged particle sources and systems

Ion sources, systems and methods

Ion beam stabilization

Sample decontamination

Determining dopant information

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Systems and methods for a gas field ion microscope

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Proximity deposition

Patents Applicationslast 30 patents

GAS DELIVERY IN A MICROSCOPE SYSTEM

VARIABLE ENERGY CHARGED PARTICLE SYSTEMS

ION SOURCES, SYSTEMS AND METHODS

ION BEAM STABILIZATION

METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SO...

CHARGED PARTICLE DETECTORS

ION SOURCES, SYSTEMS AND METHODS

ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS

ELECTRON DETECTION SYSTEMS AND METHODS

SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS

REDUCING PARTICLE IMPLANTATION

GAS FIELD ION SOURCE WITH COATED TIP

ICE LAYERS IN CHARGED PARTICLE SYSTEMS AND METHODS

ION BEAM STABILIZATION

MULTIPLE CURRENT CHARGED PARTICLE METHODS

INCREASING CURRENT IN CHARGED PARTICLE SOURCES AND SYSTEMS

SAMPLE DECONTAMINATION

ION SOURCES, SYSTEMS AND METHODS

Ion sources, systems and methods