John Andrew Hunt

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cryotransfer holder and workstation
- Patent number 11,908,655
- Issue date Feb 20, 2024
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for wavelength resolved angular resolved cathodoluminescence
- Patent number 11,764,032
- Issue date Sep 19, 2023
- Gatan, Inc.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
System and method for alignment of cathodoluminescence optics
- Patent number 11,205,559
- Issue date Dec 21, 2021
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for determining, using, and indicating ion be...
- Patent number 11,004,656
- Issue date May 11, 2021
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for wavelength resolved angular resolved cathodoluminescence
- Patent number 10,943,764
- Issue date Mar 9, 2021
- Gatan, Inc.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 10,832,887
- Issue date Nov 10, 2020
- Gatan, Inc.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation and coating apparatus and methods
- Patent number 10,731,246
- Issue date Aug 4, 2020
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathodoluminescence optical hub
- Patent number 10,707,051
- Issue date Jul 7, 2020
- Gatan, Inc.
- John Andrew Hunt
- G02 - OPTICS
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 10,110,854
- Issue date Oct 23, 2018
- Gatan, Inc.
- John Andrew Hunt
- G02 - OPTICS
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 9,196,455
- Issue date Nov 24, 2015
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,791,438
- Issue date Jul 29, 2014
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,729,510
- Issue date May 20, 2014
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,653,489
- Issue date Feb 18, 2014
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation thermal management apparatus and methods
- Patent number 8,610,090
- Issue date Dec 17, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,592,763
- Issue date Nov 26, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,445,874
- Issue date May 21, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Integrated backscattered electron detector with cathodoluminescence...
- Patent number 8,410,443
- Issue date Apr 2, 2013
- Gatan, Inc.
- David J. Stowe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam sample preparation thermal management apparatus and methods
- Patent number 8,384,050
- Issue date Feb 26, 2013
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,283,642
- Issue date Oct 9, 2012
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for improving resolution and reducing noise i...
- Patent number 6,414,309
- Issue date Jul 2, 2002
- Gatan, Inc.
- Paul E. Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for improving resolution and reducing noise i...
- Patent number 6,194,719
- Issue date Feb 27, 2001
- Gatan, Inc.
- Paul E. Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated set up of an energy filtering transmission electron micro...
- Patent number 6,184,524
- Issue date Feb 6, 2001
- Gatan, Inc.
- Henri Adriaan Brink
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS
- Publication number 20230373028
- Publication date Nov 23, 2023
- GATAN, INC.
- Steven Thomas COYLE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS
- Publication number 20230311244
- Publication date Oct 5, 2023
- GATAN, INC.
- Steven Thomas COYLE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE
- Publication number 20210313141
- Publication date Oct 7, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE
- Publication number 20210210305
- Publication date Jul 8, 2021
- GATAN, INC.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS
- Publication number 20210125807
- Publication date Apr 29, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOTRANSFER HOLDER AND WORKSTATION
- Publication number 20210110991
- Publication date Apr 15, 2021
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE
- Publication number 20190371569
- Publication date Dec 5, 2019
- GATAN, INC.
- Michael Bertilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CATHODOLUMINESCENCE OPTICAL HUB
- Publication number 20190348257
- Publication date Nov 14, 2019
- GATAN, INC.
- John Andrew Hunt
- G02 - OPTICS
Information Patent Application
CRYOTRANSFER HOLDER AND WORKSTATION
- Publication number 20190131106
- Publication date May 2, 2019
- GATAN, INC.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Determining, Using, and Indicating Ion Be...
- Publication number 20160111249
- Publication date Apr 21, 2016
- GATAN, INC.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation and Coating Apparatus and Methods
- Publication number 20160024645
- Publication date Jan 28, 2016
- GATAN, INC.
- John Andrew Hunt
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20140332699
- Publication date Nov 13, 2014
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20140091237
- Publication date Apr 3, 2014
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20140077106
- Publication date Mar 20, 2014
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20140028828
- Publication date Jan 30, 2014
- GATAN, INC.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20130228702
- Publication date Sep 5, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20130228708
- Publication date Sep 5, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20130134331
- Publication date May 30, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Integrated Backscattered Electron Detector with Cathodoluminescence...
- Publication number 20130099116
- Publication date Apr 25, 2013
- GATAN, INC.
- David J. Stowe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085923
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20120085937
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085938
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085939
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Control of process gases in specimen surface treatment system
- Publication number 20060175291
- Publication date Aug 10, 2006
- John A. Hunt
- B08 - CLEANING
Information Patent Application
Methods and apparatus for improving resolution and reducing noise i...
- Publication number 20010010359
- Publication date Aug 2, 2001
- Paul E. Mooney
- H01 - BASIC ELECTRIC ELEMENTS

John Andrew Hunt

Person

Patents Grantslast 30 patents

Cryotransfer holder and workstation

Apparatus for wavelength resolved angular resolved cathodoluminescence

Apparatus for transmission electron microscopy cathodoluminescence

System and method for alignment of cathodoluminescence optics

Methods and apparatus for determining, using, and indicating ion be...

Apparatus for wavelength resolved angular resolved cathodoluminescence

Cryotransfer holder and workstation

Ion beam sample preparation and coating apparatus and methods

Cathodoluminescence optical hub

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation thermal management apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Integrated backscattered electron detector with cathodoluminescence...

Ion beam sample preparation thermal management apparatus and methods

Ion beam sample preparation apparatus and methods

Methods and apparatus for improving resolution and reducing noise i...

Methods and apparatus for improving resolution and reducing noise i...

Automated set up of an energy filtering transmission electron micro...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS

APPARATUS AND METHOD FOR SEMICONDUCTOR PACKAGE FAILURE ANALYSIS

APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE

APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE

SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS

CRYOTRANSFER HOLDER AND WORKSTATION

APPARATUS FOR WAVELENGTH RESOLVED ANGULAR RESOLVED CATHODOLUMINESCENCE

CATHODOLUMINESCENCE OPTICAL HUB

CRYOTRANSFER HOLDER AND WORKSTATION

Methods and Apparatus for Determining, Using, and Indicating Ion Be...

Ion Beam Sample Preparation and Coating Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Integrated Backscattered Electron Detector with Cathodoluminescence...

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Control of process gases in specimen surface treatment system

Methods and apparatus for improving resolution and reducing noise i...