John Connor

Person

Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electro-static discharge protection circuit
- Patent number 6,965,503
- Issue date Nov 15, 2005
- International Business Machines Corporation
- John Connor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Area efficient, sequential gray code to thermometer code decoder
- Patent number 6,617,986
- Issue date Sep 9, 2003
- International Business Machines Corporation
- John Connor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for programmable active termination of input/o...
- Patent number 6,501,293
- Issue date Dec 31, 2002
- International Business Machines Corporation
- George M. Braceras
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for testing differential signals
- Patent number 6,353,903
- Issue date Mar 5, 2002
- International Business Machines Corporation
- Robert Dean Adams
- G01 - MEASURING TESTING
Information Patent Grant
Termination resistance independent system for impedance matching in...
- Patent number 6,278,339
- Issue date Aug 21, 2001
- International Business Machines Corporation
- Wagdi W. Abadeer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Termination impedance independent system for impedance matching in...
- Patent number 6,249,193
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Wagdi W. Abadeer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-chip automatic system for impedance matching in very high speed...
- Patent number 6,140,885
- Issue date Oct 31, 2000
- International Business Machines Corporation
- Wagdi W. Abadeer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for protecting circuits subjected to high voltage
- Patent number 5,929,667
- Issue date Jul 27, 1999
- International Business Machines Corporation
- Wagdi W. Abadeer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Receiver input voltage protection circuit
- Patent number 5,815,354
- Issue date Sep 29, 1998
- International Business Machines Corporation
- George Maria Braceras
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Memory array built-in self test circuit for testing multi-port memo...
- Patent number 5,796,745
- Issue date Aug 18, 1998
- International Business Machines Corporation
- Robert D. Adams
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic dielectric protection circuit for a receiver
- Patent number 5,793,592
- Issue date Aug 11, 1998
- International Business Machines Corporation
- Robert D. Adams
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory array built-in self-test circuit having a programmable patte...
- Patent number 5,790,564
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G11 - INFORMATION STORAGE
Information Patent Grant
Test converage of embedded memories on semiconductor substrates
- Patent number 5,784,323
- Issue date Jul 21, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array built-in self-test circuit having a programmable patte...
- Patent number 5,771,242
- Issue date Jun 23, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus to determine erroneous value in memory cells u...
- Patent number 5,761,213
- Issue date Jun 2, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rapid compare of two binary numbers
- Patent number 5,745,498
- Issue date Apr 28, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using one memory to supply addresses to an associated memory during...
- Patent number 5,740,098
- Issue date Apr 14, 1998
- International Business Machines Corporation
- Robert Dean Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using one memory to supply addresses to an associated memory during...
- Patent number 5,563,833
- Issue date Oct 8, 1996
- International Business Machines Corporation
- Robert D. Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test for logic circuitry at memory array output
- Patent number 5,553,082
- Issue date Sep 3, 1996
- International Business Machines Corporation
- John P. Connor
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for output deselecting of data during test
- Patent number 5,539,753
- Issue date Jul 23, 1996
- International Business Machines Corporation
- John P. Connor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
BIST tester for multiple memories
- Patent number 5,535,164
- Issue date Jul 9, 1996
- International Business Machines Corporation
- Robert D. Adams
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT
- Publication number 20050068702
- Publication date Mar 31, 2005
- International Business Machines Corporation
- John Connor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Area efficient, sequential gray code to thermometer code decoder
- Publication number 20030071747
- Publication date Apr 17, 2003
- International Business Machines Corporation
- John Connor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR PROGRAMMABLE ACTIVE TERMINATION OF INPUT/O...
- Publication number 20020005734
- Publication date Jan 17, 2002
- GEORGE M. BRACERAS
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Termination resistance independent system for impedance matching in...
- Publication number 20010000428
- Publication date Apr 26, 2001
- Wagdi W. Abadeer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

John Connor

Person

Patents Grantslast 30 patents

Electro-static discharge protection circuit

Area efficient, sequential gray code to thermometer code decoder

Method and apparatus for programmable active termination of input/o...

Method and apparatus for testing differential signals

Termination resistance independent system for impedance matching in...

Termination impedance independent system for impedance matching in...

On-chip automatic system for impedance matching in very high speed...

Method and apparatus for protecting circuits subjected to high voltage

Receiver input voltage protection circuit

Memory array built-in self test circuit for testing multi-port memo...

Dynamic dielectric protection circuit for a receiver

Memory array built-in self-test circuit having a programmable patte...

Test converage of embedded memories on semiconductor substrates

Memory array built-in self-test circuit having a programmable patte...

Method and apparatus to determine erroneous value in memory cells u...

Rapid compare of two binary numbers

Using one memory to supply addresses to an associated memory during...

Using one memory to supply addresses to an associated memory during...

Built-in self-test for logic circuitry at memory array output

Method and apparatus for output deselecting of data during test

BIST tester for multiple memories

Patents Applicationslast 30 patents

ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT

Area efficient, sequential gray code to thermometer code decoder

METHOD AND APPARATUS FOR PROGRAMMABLE ACTIVE TERMINATION OF INPUT/O...

Termination resistance independent system for impedance matching in...