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John E. Turner
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Beaverton, OR, US
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last 30 patents
Information
Patent Grant
Programmable logic device configurable input/output cell
Patent number
4,896,296
Issue date
Jan 23, 1990
Lattice Semiconductor Corporation
John E. Turner
G01 - MEASURING TESTING
Information
Patent Grant
One-time programmable data security system for programmable logic d...
Patent number
4,887,239
Issue date
Dec 12, 1989
Lattice Semiconductor Corporation
John E. Turner
G11 - INFORMATION STORAGE
Information
Patent Grant
In-system programmable logic device
Patent number
4,879,688
Issue date
Nov 7, 1989
Lattice Semiconductor Corporation
John E. Turner
G01 - MEASURING TESTING
Information
Patent Grant
In-system programmable logic device with four dedicated terminals
Patent number
4,855,954
Issue date
Aug 8, 1989
Lattice Semiconductor Corporation
John E. Turner
G01 - MEASURING TESTING
Information
Patent Grant
Programmable data security circuit for programmable logic device
Patent number
4,852,044
Issue date
Jul 25, 1989
Lattice Semiconductor Corporation
John E. Turner
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable logic device with limited sense currents and noise red...
Patent number
4,833,646
Issue date
May 23, 1989
Lattice Semiconductor Corp.
John E. Turner
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable logic array
Patent number
4,766,569
Issue date
Aug 23, 1988
Lattice Semiconductor Corporation
John E. Turner
G01 - MEASURING TESTING
Information
Patent Grant
Programmable logic device
Patent number
4,761,768
Issue date
Aug 2, 1988
Lattice Semiconductor Corporation
John E. Turner
G01 - MEASURING TESTING