John Edward Sheets, II

Person

Zumbrota, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical stacking of field effect transistor structures for logic g...
- Patent number 8,314,001
- Issue date Nov 20, 2012
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implementing physically unclonable function (PUF) utilizing EDRAM m...
- Patent number 8,300,450
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Todd Alan Christensen
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistance sensing for defeating microchip exploitation
- Patent number 8,214,657
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Gerald K Bartley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Doped implant monitoring for microchip tamper detection
- Patent number 8,172,140
- Issue date May 8, 2012
- International Business Machines Corporation
- Gerald K Bartley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced field effect transistor
- Patent number 8,138,054
- Issue date Mar 20, 2012
- International Business Machines Corporation
- David Howard Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for creating 3-D single gate inverter
- Patent number 8,114,747
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Phil Christopher Felice Paone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power distribution in a vertically integrated circuit
- Patent number 8,105,940
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bias temperature instability-influenced storage cell
- Patent number 8,107,309
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Douglas M. Dewanz
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of enhancing on-chip inductance structure utilizing silicon...
- Patent number 8,079,134
- Issue date Dec 20, 2011
- International Business Machines Corporation
- Andrew Benson Maki
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Implementing tamper evident and resistant detection through modulat...
- Patent number 7,989,918
- Issue date Aug 2, 2011
- International Business Machines Corporation
- Gerald Keith Bartley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
- Patent number 7,935,629
- Issue date May 3, 2011
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measurement and control of photomask to su...
- Patent number 7,935,546
- Issue date May 3, 2011
- International Business Machines Corporation
- Axel Aguado Granados
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Implementing eFuse resistance determination before initiating eFuse...
- Patent number 7,915,949
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Karl Robert Erickson
- G11 - INFORMATION STORAGE
Information Patent Grant
3-D single gate inverter
- Patent number 7,868,391
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Phil Christopher Felice Paone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implementing APS voltage level activation with secondary chip in st...
- Patent number 7,865,859
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Phil C. Paone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improved power distribution in a three dimensional verti...
- Patent number 7,727,887
- Issue date Jun 1, 2010
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implementing decoupling capacitors with hot-spot thermal reduction...
- Patent number 7,723,816
- Issue date May 25, 2010
- International Business Machines Corporation
- Gerald Keith Bartley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for improved power distribution in a three dimensional ve...
- Patent number 7,701,064
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
False connection for defeating microchip exploitation
- Patent number 7,701,244
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Gerald K Bartley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FinFET body contact structure
- Patent number 7,696,565
- Issue date Apr 13, 2010
- International Business Machines Corporation
- Richard Lee Donze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
- Patent number 7,626,220
- Issue date Dec 1, 2009
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for correcting for asymmetry of threshold voltage shifts
- Patent number 7,541,829
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Ronald J. Bolam
- G01 - MEASURING TESTING
Information Patent Grant
Aligning stacked chips using resistance assistance
- Patent number 7,514,276
- Issue date Apr 7, 2009
- International Business Machines Corporation
- Corey Elizabeth Yearous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of bias of a silicon area using bridging vertices on po...
- Patent number 7,336,086
- Issue date Feb 26, 2008
- International Business Machines Corporation
- Richard Lee Donze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
- Patent number 7,317,217
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for improving performance margin in logic paths
- Patent number 7,317,605
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Richard Lee Donze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FinFET body contact structure
- Patent number 7,241,649
- Issue date Jul 10, 2007
- International Business Machines Corporation
- Richard Lee Donze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polysilicon conductor width measurement for 3-dimensional FETs
- Patent number 7,227,183
- Issue date Jun 5, 2007
- International Business Machines Corporation
- Richard Lee Donze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical open/short contact alignment structure for active region...
- Patent number 7,183,780
- Issue date Feb 27, 2007
- International Business Machines Corporation
- Richard Lee Donze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for implementing silicon wafer chip carrier pa...
- Patent number 7,050,871
- Issue date May 23, 2006
- International Business Machines Corporation
- Gerald Keith Bartley
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP TRENCH EMBEDDED GATE TRANSISTOR
- Publication number 20130146992
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical Stacking of Field Effect Transistor Structures for Logic G...
- Publication number 20130001701
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH SILICON VIA DIRECT FET SIGNAL GATING
- Publication number 20130001676
- Publication date Jan 3, 2013
- International Business Machines Corporation
- GERALD K. BARTLEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDEPENDENTLY VOLTAGE CONTROLLED VOLUME OF SILICON ON A SILICON ON...
- Publication number 20120267752
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING TEMPORARY DISABLE FUNCTION OF PROTECTED CIRCUITRY BY M...
- Publication number 20120268160
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING eFUSE CIRCUIT WITH ENHANCED eFUSE BLOW OPERATION
- Publication number 20120268195
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
eDRAM HAVING DYNAMIC RETENTION AND PERFORMANCE TRADEOFF
- Publication number 20120267697
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-EFFECT TRANSISTOR AND METHOD OF CREATING SAME
- Publication number 20120211829
- Publication date Aug 23, 2012
- International Business Machines Corporation
- Gerald K. Bartley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING HACKING DETECTION AND BLOCK FUNCTION AT INDETERMINATE...
- Publication number 20120216301
- Publication date Aug 23, 2012
- International Business Machines Corporation
- Karl R. Erickson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPLEMENTING SEMICONDUCTOR SOC WITH METAL VIA GATE NODE HIGH PERFOR...
- Publication number 20120175626
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING VERTICAL SIGNAL REPEATER TRANSISTORS UTILIZING WIRE VI...
- Publication number 20120175624
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power Domain Controller With Gated Through Silicon Via Having FET W...
- Publication number 20120146711
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Gerald K. Bartley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET WITH REDUCED GATE TO FIN OVERLAY SENSITIVITY
- Publication number 20120146112
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhanced Thin Film Field Effect Transistor Integration into Back En...
- Publication number 20120126330
- Publication date May 24, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING PHYSICALLY UNCLONABLE FUNCTION (PUF) UTILIZING EDRAM M...
- Publication number 20120106235
- Publication date May 3, 2012
- International Business Machines Corporation
- Todd Alan Christensen
- G11 - INFORMATION STORAGE
Information Patent Application
Vertically Stacked FETs With Series Bipolar Junction Transistor
- Publication number 20120032274
- Publication date Feb 9, 2012
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask Alignment, Rotation and Bias Monitor Utilizing Threshold Volta...
- Publication number 20110304350
- Publication date Dec 15, 2011
- International Business Machines Corporation
- Todd A. Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical Stacking of Field Effect Transistor Structures for Logic G...
- Publication number 20110298052
- Publication date Dec 8, 2011
- International Business Machines Corporation
- Karl R. Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical Stacking of Field Effect Transistor Structures for Logic G...
- Publication number 20110248349
- Publication date Oct 13, 2011
- International Business Machines Corporation
- Todd Alan Christensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLEMENTING EDRAM STACKED FET STRUCTURE
- Publication number 20110204428
- Publication date Aug 25, 2011
- International Business Machines Corporation
- Karl Robert Erickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EFFICIENCY OF STATIC CORE TURN-OFF IN A SYSTEM-ON-A-CHIP WITH VARIA...
- Publication number 20110172984
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELIABILITY AND PERFORMANCE OF A SYSTEM-ON-A-CHIP BY PREDICTIVE WEA...
- Publication number 20110173432
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PHOTOMASK TO SU...
- Publication number 20110096310
- Publication date Apr 28, 2011
- International Business Machines Corporation
- Axel Aguado Granados
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PHOTOMASK TO SU...
- Publication number 20110096329
- Publication date Apr 28, 2011
- International Business Machines Corporation
- Axel Aguado Granados
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
3-D Single Gate Inverter
- Publication number 20110059583
- Publication date Mar 10, 2011
- International Business Machines Corporation
- Phil Christopher Felice Paone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bias Temperature Instability-Influenced Storage Cell
- Publication number 20110013445
- Publication date Jan 20, 2011
- International Business Machines Corporation
- Douglas M. Dewanz
- G11 - INFORMATION STORAGE
Information Patent Application
3-D SINGLE GATE INVERTER
- Publication number 20100308413
- Publication date Dec 9, 2010
- International Business Machines Corporation
- Phil Christopher Felice Paone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED FIELD EFFECT TRANSISTOR
- Publication number 20100252868
- Publication date Oct 7, 2010
- International Business Machines Corporation
- David Howard Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Implementing eFuse Resistance Determination Before Initiating eFuse...
- Publication number 20100232248
- Publication date Sep 16, 2010
- International Business Machines Corporation
- Karl Robert Erickson
- G11 - INFORMATION STORAGE
Information Patent Application
IMPLEMENTING TAMPER EVIDENT AND RESISTANT DETECTION THROUGH MODULAT...
- Publication number 20100187525
- Publication date Jul 29, 2010
- International Business Machines Corporation
- Gerald Keith Bartley
- G06 - COMPUTING CALCULATING COUNTING

John Edward Sheets, II

Person

Patents Grantslast 30 patents

Vertical stacking of field effect transistor structures for logic g...

Implementing physically unclonable function (PUF) utilizing EDRAM m...

Resistance sensing for defeating microchip exploitation

Doped implant monitoring for microchip tamper detection

Enhanced field effect transistor

Method for creating 3-D single gate inverter

Power distribution in a vertically integrated circuit

Bias temperature instability-influenced storage cell

Method of enhancing on-chip inductance structure utilizing silicon...

Implementing tamper evident and resistant detection through modulat...

Semiconductor scheme for reduced circuit area in a simplified process

Method and apparatus for measurement and control of photomask to su...

Implementing eFuse resistance determination before initiating eFuse...

3-D single gate inverter

Implementing APS voltage level activation with secondary chip in st...

Method for improved power distribution in a three dimensional verti...

Implementing decoupling capacitors with hot-spot thermal reduction...

Apparatus for improved power distribution in a three dimensional ve...

False connection for defeating microchip exploitation

FinFET body contact structure

Semiconductor scheme for reduced circuit area in a simplified process

Method for correcting for asymmetry of threshold voltage shifts

Aligning stacked chips using resistance assistance

Measurement of bias of a silicon area using bridging vertices on po...

Semiconductor scheme for reduced circuit area in a simplified process

Method and apparatus for improving performance margin in logic paths

FinFET body contact structure

Polysilicon conductor width measurement for 3-dimensional FETs

Electrical open/short contact alignment structure for active region...

Method and apparatus for implementing silicon wafer chip carrier pa...

Patents Applicationslast 30 patents

DEEP TRENCH EMBEDDED GATE TRANSISTOR

Vertical Stacking of Field Effect Transistor Structures for Logic G...

THROUGH SILICON VIA DIRECT FET SIGNAL GATING

INDEPENDENTLY VOLTAGE CONTROLLED VOLUME OF SILICON ON A SILICON ON...

IMPLEMENTING TEMPORARY DISABLE FUNCTION OF PROTECTED CIRCUITRY BY M...

IMPLEMENTING eFUSE CIRCUIT WITH ENHANCED eFUSE BLOW OPERATION

eDRAM HAVING DYNAMIC RETENTION AND PERFORMANCE TRADEOFF

FIELD-EFFECT TRANSISTOR AND METHOD OF CREATING SAME

IMPLEMENTING HACKING DETECTION AND BLOCK FUNCTION AT INDETERMINATE...

IMPLEMENTING SEMICONDUCTOR SOC WITH METAL VIA GATE NODE HIGH PERFOR...

IMPLEMENTING VERTICAL SIGNAL REPEATER TRANSISTORS UTILIZING WIRE VI...

Power Domain Controller With Gated Through Silicon Via Having FET W...

FINFET WITH REDUCED GATE TO FIN OVERLAY SENSITIVITY

Enhanced Thin Film Field Effect Transistor Integration into Back En...

IMPLEMENTING PHYSICALLY UNCLONABLE FUNCTION (PUF) UTILIZING EDRAM M...

Vertically Stacked FETs With Series Bipolar Junction Transistor

Mask Alignment, Rotation and Bias Monitor Utilizing Threshold Volta...

Vertical Stacking of Field Effect Transistor Structures for Logic G...

Vertical Stacking of Field Effect Transistor Structures for Logic G...

IMPLEMENTING EDRAM STACKED FET STRUCTURE

EFFICIENCY OF STATIC CORE TURN-OFF IN A SYSTEM-ON-A-CHIP WITH VARIA...

RELIABILITY AND PERFORMANCE OF A SYSTEM-ON-A-CHIP BY PREDICTIVE WEA...

METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PHOTOMASK TO SU...

METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PHOTOMASK TO SU...

3-D Single Gate Inverter

Bias Temperature Instability-Influenced Storage Cell

3-D SINGLE GATE INVERTER

ENHANCED FIELD EFFECT TRANSISTOR

Implementing eFuse Resistance Determination Before Initiating eFuse...

IMPLEMENTING TAMPER EVIDENT AND RESISTANT DETECTION THROUGH MODULAT...