Membership
Tour
Register
Log in
John J. Shushereba
Follow
Person
Essex Junction, VT, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Built-in dynamic stress for integrated circuits
Patent number
5,982,189
Issue date
Nov 9, 1999
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING
Information
Patent Grant
Weighted random pattern built-in self-test
Patent number
5,983,380
Issue date
Nov 9, 1999
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING
Information
Patent Grant
Logic built in self-test diagnostic method
Patent number
5,930,270
Issue date
Jul 27, 1999
International Business Machines Corporation
Donato O. Forlenza
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for reducing test data storage requirements for high spee...
Patent number
4,696,005
Issue date
Sep 22, 1987
International Business Machines Corporation
Ernest H. Millham
G01 - MEASURING TESTING