John L. Dunklee

Person

Tigard, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 11,313,902
- Issue date Apr 26, 2022
- Celadon Systems, Inc.
- John L. Dunklee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 10,620,262
- Issue date Apr 14, 2020
- Celadon Systems, Inc.
- John L. Dunklee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card with stress relieving feature
- Patent number 10,295,565
- Issue date May 21, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 10,261,124
- Issue date Apr 16, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe core with a latch mechanism
- Patent number 10,254,309
- Issue date Apr 9, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with stress relieving feature
- Patent number 10,254,311
- Issue date Apr 9, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 10,145,863
- Issue date Dec 4, 2018
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 9,726,694
- Issue date Aug 8, 2017
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe card and connector mechanism
- Patent number 9,024,651
- Issue date May 5, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe card and connector mechanism
- Patent number 9,018,966
- Issue date Apr 28, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 8,994,390
- Issue date Mar 31, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Top contact layout board in an electrical system
- Patent number D722031
- Issue date Feb 3, 2015
- Celadon Systems, Inc.
- John L. Dunklee
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Support for a probe test core
- Patent number D713363
- Issue date Sep 16, 2014
- Celadon Systems, Inc.
- William A. Funk
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,969,173
- Issue date Jun 28, 2011
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,876,115
- Issue date Jan 25, 2011
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,688,091
- Issue date Mar 30, 2010
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Probe station
- Patent number 7,688,062
- Issue date Mar 30, 2010
- Cascade Microtech, Inc.
- Greg Nordgren
- G01 - MEASURING TESTING
Information Patent Grant
Guarded tub enclosure
- Patent number 7,639,003
- Issue date Dec 29, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Fluid dispensing system
- Patent number 7,618,590
- Issue date Nov 17, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 7,616,017
- Issue date Nov 10, 2009
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Probe station
- Patent number 7,554,322
- Issue date Jun 30, 2009
- Cascade Microtech, Inc.
- Greg Nordgren
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,518,358
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,518,387
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,514,915
- Issue date Apr 7, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,501,810
- Issue date Mar 10, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low inductance path
- Patent number 7,498,828
- Issue date Mar 3, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,492,172
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,489,149
- Issue date Feb 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,482,823
- Issue date Jan 27, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Switched suspended conductor and connection
- Patent number 7,468,609
- Issue date Dec 23, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20200341055
- Publication date Oct 29, 2020
- Celadon Systems, Inc.
- John L. DUNKLEE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20190235018
- Publication date Aug 1, 2019
- Celadon Systems, Inc.
- John L. DUNKLEE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20190011498
- Publication date Jan 10, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20180024165
- Publication date Jan 25, 2018
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD WITH STRESS RELIEVING FEATURE
- Publication number 20170285069
- Publication date Oct 5, 2017
- CELADON SYSTEMS, INC.
- John L. DUNKLEE
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM
- Publication number 20160320428
- Publication date Nov 3, 2016
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20150204911
- Publication date Jul 23, 2015
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
- Publication number 20140239996
- Publication date Aug 28, 2014
- Intel Corporation
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20140225636
- Publication date Aug 14, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
- Publication number 20140210501
- Publication date Jul 31, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20100109695
- Publication date May 6, 2010
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20090153167
- Publication date Jun 18, 2009
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20080157796
- Publication date Jul 3, 2008
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080054884
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054929
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080054885
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054923
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080054883
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080048692
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080048648
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080048647
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20080042680
- Publication date Feb 21, 2008
- Cascade Microtech Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080042374
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20080042376
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Greg Nordgren
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20080042670
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Greg Nordgren
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080042674
- Publication date Feb 21, 2008
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20080042642
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe station
- Publication number 20080042669
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Greg Nordgren
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080024149
- Publication date Jan 31, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low inductance path
- Publication number 20070247178
- Publication date Oct 25, 2007
- John Dunklee
- G01 - MEASURING TESTING

John L. Dunklee

Person

Patents Grantslast 30 patents

Modular rail systems, rail systems, mechanisms, and equipment for d...

Modular rail systems, rail systems, mechanisms, and equipment for d...

Probe card with stress relieving feature

Modular rail systems, rail systems, mechanisms, and equipment for d...

Test apparatus having a probe core with a latch mechanism

Probe card with stress relieving feature

Test systems with a probe apparatus and index mechanism

Test systems with a probe apparatus and index mechanism

Test apparatus having a probe card and connector mechanism

Test apparatus having a probe card and connector mechanism

Test systems with a probe apparatus and index mechanism

Top contact layout board in an electrical system

Support for a probe test core

Chuck for holding a device under test

Chuck for holding a device under test

Chuck with integrated wafer support

Probe station

Guarded tub enclosure

Fluid dispensing system

Probe station thermal chuck with shielding for capacitive current

Probe station

Chuck for holding a device under test

Shielded probe for testing a device under test

Chuck for holding a device under test

Chuck for holding a device under test

Probe station with low inductance path

Chuck for holding a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Switched suspended conductor and connection

Patents Applicationslast 30 patents

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

PROBE CARD WITH STRESS RELIEVING FEATURE

TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM

Chuck for holding a device under test

Chuck for holding a device under test

Chuck with integrated wafer support

Chuck for holding a device under test

Probe for testing a device under test

Chuck for holding a device under test

Probe for testing a device under test

Chuck for holding a device under test

Probe for testing a device under test

Chuck for holding a device under test

Chuck for holding a device under test

Probe station thermal chuck with shielding for capacitive current

Chuck for holding a device under test

Probe station

Probe station

Chuck for holding a device under test

Chuck for holding a device under test

Probe station

Probe for testing a device under test

Probe station with low inductance path